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Kenpei Suzuki
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Tokyo, JP
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last 30 patents
Information
Patent Grant
Test handler having turn table
Patent number
5,894,217
Issue date
Apr 13, 1999
Advantest Corp.
Noriyuki Igarashi
G01 - MEASURING TESTING
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Patent Grant
Device transfer mechanism for IC test handler
Patent number
5,617,945
Issue date
Apr 8, 1997
Advantest Corporation
Hiroyuki Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Contact drive assembly for use with electronic part test equipment
Patent number
4,370,011
Issue date
Jan 25, 1983
Takeda Riken Kogyo Kabushikikaisha
Kenpei Suzuki
G01 - MEASURING TESTING