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Kenshiro Ohtsubo

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Inspection system
    • Patent number 9,535,009
    • Issue date Jan 3, 2017
    • Hitachi High-Technologies Corporation
    • Kenshiro Ohtsubo
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
    • Publication number 20230060883
    • Publication date Mar 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takeru UTSUGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Substrate Inspection Device
    • Publication number 20230017599
    • Publication date Jan 19, 2023
    • Hitachi High-Tech Corporation
    • Yoshihiro SATOU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INSPECTION SYSTEM
    • Publication number 20150131087
    • Publication date May 14, 2015
    • Hitachi High-Technologies Corporation
    • Kenshiro Ohtsubo
    • G01 - MEASURING TESTING