Kensuke Kobayashi

Person

  • Airmont, NY, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Sequential timebase

    • Patent number 7,653,500
    • Issue date Jan 26, 2010
    • LeCroy Corporation
    • Kensuke Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sequential timebase

    • Patent number 7,280,930
    • Issue date Oct 9, 2007
    • LeCroy Corporation
    • Kensuke Kobayashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Sequential timebase

    • Publication number 20080054967
    • Publication date Mar 6, 2008
    • LeCroy Corporation
    • Kensuke Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sequential timebase

    • Publication number 20060178850
    • Publication date Aug 10, 2006
    • LeCroy Corporation
    • Kensuke Kobayashi
    • G01 - MEASURING TESTING