Kent D. Henry

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Brooklyn, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,797,946
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,639,216
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
- Patent number RE36892
- Issue date Oct 3, 2000
- Agilent Technologies
- James A. Apffel
- 250 - Radiant energy
Information Patent Grant
Spatially-resolved electrical deflection mass spectrometry
- Patent number 5,872,356
- Issue date Feb 16, 1999
- Hewlett-Packard Company
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber and mass spectrometry system containing an asymm...
- Patent number 5,838,003
- Issue date Nov 17, 1998
- Hewlett-Packard Company
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber and mass spectrometry system containing an easil...
- Patent number 5,736,741
- Issue date Apr 7, 1998
- Hewlett-Packard Company
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Orthogonal ion sampling for apci mass spectrometry
- Publication number 20040046118
- Publication date Mar 11, 2004
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20030075680
- Publication date Apr 24, 2003
- James A. Apffel
- G01 - MEASURING TESTING