Kent D. Layton

Person

Lehi, UT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical safety device miswire detection
- Patent number 10,141,734
- Issue date Nov 27, 2018
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Single wound current transformer impedance measurement circuit
- Patent number 9,897,636
- Issue date Feb 20, 2018
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Ground fault circuit interrupter and method
- Patent number 9,680,421
- Issue date Jun 13, 2017
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ground fault circuit interrupter and method
- Patent number 9,645,192
- Issue date May 9, 2017
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Ground fault circuit interrupter and method
- Patent number 9,331,469
- Issue date May 3, 2016
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Impedance measuring circuit
- Patent number 9,329,216
- Issue date May 3, 2016
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for determining a circuit element parameter
- Patent number 9,330,875
- Issue date May 3, 2016
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Current saturation detection and clamping circuit and method
- Patent number 9,124,094
- Issue date Sep 1, 2015
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Ground fault circuit interrupter and method
- Patent number 8,390,297
- Issue date Mar 5, 2013
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Bi-directional current measurement circuit that uses a transconduct...
- Patent number 6,946,828
- Issue date Sep 20, 2005
- AMI Semiconductor, Inc.
- Kent D. Layton
- G01 - MEASURING TESTING
Information Patent Grant
Stable floating gate voltage reference using interconnected current...
- Patent number 6,768,371
- Issue date Jul 27, 2004
- AMI Semiconductor, Inc.
- Kent D. Layton
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE WOUND CURRENT TRANSFORMER IMPEDANCE MEASUREMENT CIRCUIT
- Publication number 20160238644
- Publication date Aug 18, 2016
- Semiconductor Components Industries, LLC
- Riley D. Beck
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SAFETY DEVICE MISWIRE DETECTION
- Publication number 20160118785
- Publication date Apr 28, 2016
- Semiconductor Components Industries, LLC
- Riley D. BECK
- G01 - MEASURING TESTING
Information Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
- Publication number 20140266272
- Publication date Sep 18, 2014
- Semiconductor Components Industries, LLC
- Riley D. Beck
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SATURATION DETECTION AND CLAMPING CIRCUIT AND METHOD
- Publication number 20140268435
- Publication date Sep 18, 2014
- Semiconductor Components Industries, LLC
- Riley D. Beck
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR DETERMINING A CIRCUIT ELEMENT PARAMETER
- Publication number 20140210484
- Publication date Jul 31, 2014
- Riley D. Beck
- G01 - MEASURING TESTING
Information Patent Application
IMPEDANCE MEASURING CIRCUIT
- Publication number 20130214800
- Publication date Aug 22, 2013
- Riley D. Beck
- G01 - MEASURING TESTING
Information Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
- Publication number 20130215537
- Publication date Aug 22, 2013
- Semiconductor Components Industries, LLC
- Riley D. Beck
- G01 - MEASURING TESTING
Information Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
- Publication number 20110080177
- Publication date Apr 7, 2011
- Riley D. Beck
- G01 - MEASURING TESTING

Kent D. Layton

Person

Patents Grantslast 30 patents

Electrical safety device miswire detection

Single wound current transformer impedance measurement circuit

Ground fault circuit interrupter and method

Ground fault circuit interrupter and method

Ground fault circuit interrupter and method

Impedance measuring circuit

Method for determining a circuit element parameter

Current saturation detection and clamping circuit and method

Ground fault circuit interrupter and method

Bi-directional current measurement circuit that uses a transconduct...

Stable floating gate voltage reference using interconnected current...

Patents Applicationslast 30 patents

SINGLE WOUND CURRENT TRANSFORMER IMPEDANCE MEASUREMENT CIRCUIT

ELECTRICAL SAFETY DEVICE MISWIRE DETECTION

GROUND FAULT CIRCUIT INTERRUPTER AND METHOD

CURRENT SATURATION DETECTION AND CLAMPING CIRCUIT AND METHOD

METHOD FOR DETERMINING A CIRCUIT ELEMENT PARAMETER

IMPEDANCE MEASURING CIRCUIT

GROUND FAULT CIRCUIT INTERRUPTER AND METHOD

GROUND FAULT CIRCUIT INTERRUPTER AND METHOD