Kent J. Gillig

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College Station, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,084,395
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,019,286
- Issue date Mar 28, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Mobility spectrometer
- Patent number 6,897,437
- Issue date May 24, 2005
- Ionwerks
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 6,683,299
- Issue date Jan 27, 2004
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Periodic field focusing ion mobility spectrometer
- Patent number 6,639,213
- Issue date Oct 28, 2003
- The Texas A&M University System
- Kent J. Gillig
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20050127289
- Publication date Jun 16, 2005
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20040113064
- Publication date Jun 17, 2004
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20030001087
- Publication date Jan 2, 2003
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Periodic field focusing ion mobility spectrometer
- Publication number 20010032930
- Publication date Oct 25, 2001
- Kent J. Gillig
- G01 - MEASURING TESTING
Information Patent Application
Mobility spectrometer
- Publication number 20010032929
- Publication date Oct 25, 2001
- Katrin Fuhrer
- G01 - MEASURING TESTING