Kent James GILLIG

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Ion migration rate analysis device and analysis method applied
- Patent number 11,164,735
- Issue date Nov 2, 2021
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Kent James Gillig
- G01 - MEASURING TESTING
Information Patent Grant
Ion mobility analyzer and analysis method
- Patent number 10,739,308
- Issue date Aug 11, 2020
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Kent James Gillig
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION MIGRATION RATE ANALYSIS DEVICE AND ANALYSIS METHOD APPLIED
- Publication number 20190164737
- Publication date May 30, 2019
- SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
- Kent James GILLIG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYZER AND ANALYSIS METHOD
- Publication number 20190162698
- Publication date May 30, 2019
- SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
- Kent James GILLIG
- H01 - BASIC ELECTRIC ELEMENTS