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Kentaro Fukai

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  • Chiba, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 11,624,789
    • Issue date Apr 11, 2023
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,290,097
    • Issue date Mar 29, 2022
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Stress compensation control circuit and semiconductor sensor device
    • Patent number 11,137,453
    • Issue date Oct 5, 2021
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,131,721
    • Issue date Sep 28, 2021
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Magnetic sensor and magnetic sensor device
    • Patent number 10,495,697
    • Issue date Dec 3, 2019
    • ABLIC INC.
    • Kentaro Fukai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor and magnetic sensor device
    • Patent number 10,401,438
    • Issue date Sep 3, 2019
    • ABLIC INC.
    • Kentaro Fukai
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Magnetic sensor
    • Patent number 9,810,746
    • Issue date Nov 7, 2017
    • SII Semiconductor Corporation
    • Kentaro Fukai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor circuit with power supply fluctuation detection
    • Patent number 9,638,761
    • Issue date May 2, 2017
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,453,888
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,453,889
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Takemasa Miura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,267,818
    • Issue date Feb 23, 2016
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,261,569
    • Issue date Feb 16, 2016
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,128,127
    • Issue date Sep 8, 2015
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,866,474
    • Issue date Oct 21, 2014
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210389386
    • Publication date Dec 16, 2021
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210297070
    • Publication date Sep 23, 2021
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200292632
    • Publication date Sep 17, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    STRESS COMPENSATION CONTROL CIRCUIT AND SEMICONDUCTOR SENSOR DEVICE
    • Publication number 20200233045
    • Publication date Jul 23, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND MAGNETIC SENSOR DEVICE
    • Publication number 20190339336
    • Publication date Nov 7, 2019
    • ABLIC Inc.
    • Kentaro FUKAI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    MAGNETIC SENSOR AND MAGNETIC SENSOR DEVICE
    • Publication number 20170261566
    • Publication date Sep 14, 2017
    • SII Semiconductor Corporation
    • Kentaro FUKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20150377983
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Takemasa MIURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20150377647
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Kentaro FUKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150276891
    • Publication date Oct 1, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20150115942
    • Publication date Apr 30, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150040687
    • Publication date Feb 12, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150022241
    • Publication date Jan 22, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20140232387
    • Publication date Aug 21, 2014
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20130076350
    • Publication date Mar 28, 2013
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING