Kentaro Jinno

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current flaw detection probe
- Patent number 11,366,080
- Issue date Jun 21, 2022
- Mitsubishi Heavy Industries, Ltd.
- Kentaro Jinno
- G01 - MEASURING TESTING
Information Patent Grant
Coil-type eddy current flaw detecting probe
- Patent number 11,105,773
- Issue date Aug 31, 2021
- Mitsubishi Heavy Industries, Ltd.
- Kentaro Jinno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCALE THICKNESS MEASURING METHOD
- Publication number 20240255268
- Publication date Aug 1, 2024
- Mitsubishi Heavy Industries, Ltd.
- Kentaro Jinno
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD AND DEVICE FOR ULTRASONIC INSPECTION AND T...
- Publication number 20230112790
- Publication date Apr 13, 2023
- Mitsubishi Heavy Industries, Ltd.
- Keiichi Morishita
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING DIELECTRIC FILM
- Publication number 20210305493
- Publication date Sep 30, 2021
- Mitsubishi Heavy Industries, Ltd.
- Yasuhiko TSURU
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION PROBE
- Publication number 20210010974
- Publication date Jan 14, 2021
- Mitsubishi Heavy Industries, Ltd.
- Kentaro Jinno
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTING PROBE
- Publication number 20190353618
- Publication date Nov 21, 2019
- Mitsubishi Heavy Industries, Ltd.
- Kentaro Jinno
- G01 - MEASURING TESTING