Kentaro Kiriyama

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Plasma spectroscopy analysis method
- Patent number 10,551,323
- Issue date Feb 4, 2020
- ARKRAY, Inc.
- Kojiro Honma
- G01 - MEASURING TESTING
Information Patent Grant
Plasma spectroscopy analysis method
- Patent number 10,539,548
- Issue date Jan 21, 2020
- ARKRAY, Inc.
- Kentaro Kiriyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Plasma Spectroscopy Analysis Method
- Publication number 20190011427
- Publication date Jan 10, 2019
- ARKRAY, Inc.
- Kentaro Kiriyama
- G01 - MEASURING TESTING
Information Patent Application
Plasma Spectroscopy Analysis Method
- Publication number 20190011370
- Publication date Jan 10, 2019
- ARKRAY, Inc.
- Kojiro Honma
- G01 - MEASURING TESTING