Kentaro KOBAYASHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitor and method for producing same, and capacitor-mounting method
- Patent number 11,908,635
- Issue date Feb 20, 2024
- Nippon Chemi-Con Corporation
- Kentaro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle inspection system and driving method employed therein
- Patent number 10,533,934
- Issue date Jan 14, 2020
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Microanalysis chip
- Patent number 10,337,976
- Issue date Jul 2, 2019
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor micro-analysis chip and method of manufacturing the same
- Patent number 10,279,348
- Issue date May 7, 2019
- Kabushiki Kaisha Toshiba
- Hiroko Miki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor micro-analysis chip and method of manufacturing the same
- Patent number 10,281,429
- Issue date May 7, 2019
- Kabushiki Kaisha Toshiba
- Kentaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis chip and particle inspection method
- Patent number 10,113,947
- Issue date Oct 30, 2018
- Kabushiki Kaisha Toshiba
- Kentaro Kobayashi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis package for detecting particles in a sample liquid
- Patent number 9,895,691
- Issue date Feb 20, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis package for detecting particles in a sample liquid includi...
- Patent number 9,885,680
- Issue date Feb 6, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis package for detecting particles in a sample liquid, and in...
- Patent number 9,770,714
- Issue date Sep 26, 2017
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor analysis microchip and method of manufacturing the same
- Patent number 9,448,153
- Issue date Sep 20, 2016
- Kabushiki Kaisha Toshiba
- Kentaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical interconnection device and method of manufacturing the same
- Patent number 9,341,776
- Issue date May 17, 2016
- Kabushiki Kaisha Toshiba
- Norio Iizuka
- G02 - OPTICS
Information Patent Grant
Sample detection apparatus and detection method
- Patent number 9,316,576
- Issue date Apr 19, 2016
- Kabushiki Kaisha Toshiba
- Sadato Hongo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITOR AND METHOD FOR PRODUCING SAME, AND CAPACITOR-MOUNTING METHOD
- Publication number 20220238283
- Publication date Jul 28, 2022
- NIPPON CHEMI-CON CORPORATION
- Kentaro KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS CHIP
- Publication number 20210096099
- Publication date Apr 1, 2021
- Aipore Inc.
- Kentaro Kobayashi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DETECTION DEVICE, DETECTION METHOD, AND ELECTRODE WITH PROBE
- Publication number 20190064157
- Publication date Feb 28, 2019
- Kabushiki Kaisha Toshiba
- Takuya MIYAGAWA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS CHIP
- Publication number 20180088081
- Publication date Mar 29, 2018
- Kabushiki Kaisha Toshiba
- Kentaro Kobayashi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN
- Publication number 20170122859
- Publication date May 4, 2017
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
- Publication number 20170122905
- Publication date May 4, 2017
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR ANALYSIS CHIP AND PARTICLE INSPECTION METHOD
- Publication number 20170074824
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM
- Publication number 20160320286
- Publication date Nov 3, 2016
- Kabushiki Kaisha Toshiba
- Hiroko MIKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231265
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231262
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231263
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160187295
- Publication date Jun 30, 2016
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
MICROANALYSIS CHIP
- Publication number 20160153935
- Publication date Jun 2, 2016
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
- Publication number 20150041316
- Publication date Feb 12, 2015
- Kabushiki Kaisha Toshiba
- Hiroko MIKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND MANUFACTURING METHOD THEREOF
- Publication number 20140256028
- Publication date Sep 11, 2014
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE DETECTION APPARATUS AND DETECTION METHOD
- Publication number 20140255911
- Publication date Sep 11, 2014
- Kabushiki Kaisha Toshiba
- Sadato HONGO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR ANALYSIS MICROCHIP AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140252505
- Publication date Sep 11, 2014
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND SAMPLE LIQUID FLOWING METHOD
- Publication number 20140256031
- Publication date Sep 11, 2014
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERCONNECTION DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140044391
- Publication date Feb 13, 2014
- KABUSHIKI KAISHA TOSHIBA
- Norio IIZUKA
- G02 - OPTICS
Information Patent Application
FLEXIBLE OPTOELECTRONIC WIRING MODULE
- Publication number 20130108210
- Publication date May 2, 2013
- Hiroshi UEMURA
- G02 - OPTICS

Kentaro KOBAYASHI

Person

Patents Grantslast 30 patents

Capacitor and method for producing same, and capacitor-mounting method

Particle inspection system and driving method employed therein

Microanalysis chip

Semiconductor micro-analysis chip and method of manufacturing the same

Semiconductor micro-analysis chip and method of manufacturing the same

Semiconductor analysis chip and particle inspection method

Analysis package for detecting particles in a sample liquid

Analysis package for detecting particles in a sample liquid includi...

Analysis package for detecting particles in a sample liquid, and in...

Semiconductor analysis microchip and method of manufacturing the same

Optical interconnection device and method of manufacturing the same

Sample detection apparatus and detection method

Patents Applicationslast 30 patents

CAPACITOR AND METHOD FOR PRODUCING SAME, AND CAPACITOR-MOUNTING METHOD

ANALYSIS CHIP

DETECTION DEVICE, DETECTION METHOD, AND ELECTRODE WITH PROBE

ANALYSIS CHIP

PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR ANALYSIS CHIP AND PARTICLE INSPECTION METHOD

PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM

ANALYSIS PACKAGE

ANALYSIS PACKAGE

ANALYSIS PACKAGE

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME

MICROANALYSIS CHIP

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND MANUFACTURING METHOD THEREOF

SAMPLE DETECTION APPARATUS AND DETECTION METHOD

SEMICONDUCTOR ANALYSIS MICROCHIP AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND SAMPLE LIQUID FLOWING METHOD

OPTICAL INTERCONNECTION DEVICE AND METHOD OF MANUFACTURING THE SAME

FLEXIBLE OPTOELECTRONIC WIRING MODULE