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Kentaro Nemoto
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical device and optical measuring machine
Patent number
11,656,425
Issue date
May 23, 2023
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement head for coordinate measurement
Patent number
D957960
Issue date
Jul 19, 2022
Mitutoyo Corporation
Kentaro Nemoto
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Optical measurement head for coordinate measurement
Patent number
D957961
Issue date
Jul 19, 2022
Mitutoyo Corporation
Kentaro Nemoto
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Shape measuring device
Patent number
10,895,449
Issue date
Jan 19, 2021
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring apparatus
Patent number
10,852,128
Issue date
Dec 1, 2020
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Coordinate measuring machine and coordinate measuring method
Patent number
10,612,904
Issue date
Apr 7, 2020
Mitutoyo Corporation
Hidetaka Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring apparatus
Patent number
9,989,356
Issue date
Jun 5, 2018
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement head for coordinate measurement
Patent number
D805409
Issue date
Dec 19, 2017
Mitutoyo Corporation
Sadayuki Matsumiya
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Multi-joint arm type measurement apparatus
Patent number
9,689,663
Issue date
Jun 27, 2017
Mitutoyo Corporation
Yuichi Nagataki
G01 - MEASURING TESTING
Information
Patent Grant
Illumination apparatus, illumination method, measuring apparatus, a...
Patent number
9,500,474
Issue date
Nov 22, 2016
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, attachable cover, and shape measuring apparatus
Patent number
9,255,792
Issue date
Feb 9, 2016
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe
Patent number
8,964,281
Issue date
Feb 24, 2015
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe
Patent number
8,908,256
Issue date
Dec 9, 2014
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Image measuring apparatus
Patent number
8,643,718
Issue date
Feb 4, 2014
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Shape measurement device
Patent number
8,553,234
Issue date
Oct 8, 2013
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
Patent number
8,416,426
Issue date
Apr 9, 2013
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
Patent number
8,139,229
Issue date
Mar 20, 2012
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Grant
Probe straightness measuring method
Patent number
7,869,970
Issue date
Jan 11, 2011
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Measurement control device and measurement control method
Patent number
7,784,333
Issue date
Aug 31, 2010
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring front and back surfaces of target object
Patent number
7,701,562
Issue date
Apr 20, 2010
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Grant
Probe and contour measuring instrument
Patent number
7,352,271
Issue date
Apr 1, 2008
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL DEVICE AND OPTICAL MEASURING MACHINE
Publication number
20210116668
Publication date
Apr 22, 2021
Mitutoyo Corporation
Kentaro Nemoto
G02 - OPTICS
Information
Patent Application
SHAPE MEASURING DEVICE
Publication number
20200132439
Publication date
Apr 30, 2020
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Application
COORDINATE MEASURING MACHINE AND COORDINATE MEASURING METHOD
Publication number
20180328706
Publication date
Nov 15, 2018
Mitutoyo Corporation
Hidetaka Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
MULTI-JOINT ARM TYPE MEASUREMENT APPARATUS
Publication number
20150345933
Publication date
Dec 3, 2015
Mitutoyo Corporation
Yuichi NAGATAKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS
Publication number
20150226544
Publication date
Aug 13, 2015
MITUTOYO CORPORATION
Kentaro NEMOTO
G02 - OPTICS
Information
Patent Application
OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS
Publication number
20150226543
Publication date
Aug 13, 2015
MITUTOYO CORPORATION
Kentaro NEMOTO
G02 - OPTICS
Information
Patent Application
ILLUMINATION APPARATUS, ILLUMINATION METHOD, MEASURING APPARATUS, A...
Publication number
20150211842
Publication date
Jul 30, 2015
MITUTOYO CORPORATION
Masaoki YAMAGATA
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING APPARATUS
Publication number
20140253724
Publication date
Sep 11, 2014
MITUTOYO CORPORATION
Masaoki YAMAGATA
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING APPARATUS
Publication number
20140232855
Publication date
Aug 21, 2014
MITUTOYO CORPORATION
Masaoki YAMAGATA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROBE
Publication number
20130083384
Publication date
Apr 4, 2013
Mitutoyo Corporation
Masaoki Yamagata
G02 - OPTICS
Information
Patent Application
SHAPE MEASUREMENT DEVICE
Publication number
20120262724
Publication date
Oct 18, 2012
MITUTOYO CORPORATION
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASUREMENT DEVICE
Publication number
20120262726
Publication date
Oct 18, 2012
MITUTOYO CORPORATION
Kentaro Nemoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CAL...
Publication number
20120188558
Publication date
Jul 26, 2012
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
IMAGE MEASURING APPARATUS
Publication number
20120098963
Publication date
Apr 26, 2012
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
Calibrating jig, profile measuring device, and method of offset cal...
Publication number
20100007895
Publication date
Jan 14, 2010
Mitutoyo Corporation
Masaoki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
Method of measuring front and back surfaces of target object
Publication number
20090207403
Publication date
Aug 20, 2009
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Application
PROBE STRAIGHTNESS MEASURING METHOD
Publication number
20090198472
Publication date
Aug 6, 2009
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Application
Measurement control device, contour measuring instrument and measur...
Publication number
20070266781
Publication date
Nov 22, 2007
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING
Information
Patent Application
Probe and contour measuring instrument
Publication number
20070266582
Publication date
Nov 22, 2007
Mitutoyo Corporation
Kentaro Nemoto
G01 - MEASURING TESTING