TREA

Kentaro Nishikata

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  • Kyoto, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray analyzer
    • Patent number 9,170,220
    • Issue date Oct 27, 2015
    • Horiba, Ltd.
    • Kentaro Nishikata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample measuring device
    • Patent number 7,589,322
    • Issue date Sep 15, 2009
    • Horiba, Ltd.
    • Kentaro Nishikata
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY ANALYZER
    • Publication number 20140326881
    • Publication date Nov 6, 2014
    • Kentaro Nishikata
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample measuring device
    • Publication number 20070023655
    • Publication date Feb 1, 2007
    • Kentaro Nishikata
    • H01 - BASIC ELECTRIC ELEMENTS