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Kentaro Ozawa
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Kanagawa, JP
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last 30 patents
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Patent Grant
Apparatus and method for displaying a signal waveform
Patent number
6,064,365
Issue date
May 16, 2000
Leader Electronics, Corporation
Kentaro Ozawa
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for displaying a signal waveform
Patent number
5,742,275
Issue date
Apr 21, 1998
Leader Electronics Corp.
Kentaro Ozawa
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for calibrating electronic scales for the hori...
Patent number
5,410,245
Issue date
Apr 25, 1995
Leader Electronics Corp.
Kenzo Ikuzawa
G01 - MEASURING TESTING