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Kentaro Wada
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Hitachinaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic analysis apparatus and automatic analysis method
Patent number
8,997,589
Issue date
Apr 7, 2015
Hitachi High-Technologies Corporation
Hidenobu Komatsu
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer
Patent number
8,278,108
Issue date
Oct 2, 2012
Hitachi High-Technologies Corporation
Kentaro Wada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
AUTOMATIC ANALYZER
Publication number
20110283779
Publication date
Nov 24, 2011
Hitachi High-Technologies Corporation
Kentaro Wada
G01 - MEASURING TESTING
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Patent Application
AUTOMATIC ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS METHOD
Publication number
20110271773
Publication date
Nov 10, 2011
Hitachi High-Technologies Corporation
Hidenobu Komatsu
G01 - MEASURING TESTING