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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Attenuated total reflection measuring apparatus capable of Raman sp...
Patent number
11,898,908
Issue date
Feb 13, 2024
Jasco Corporation
Masateru Usuki
G01 - MEASURING TESTING
Information
Patent Grant
Microspectroscope having position correction function
Patent number
11,635,605
Issue date
Apr 25, 2023
Jasco Corporation
Kento Aizawa
G01 - MEASURING TESTING
Information
Patent Grant
Raman microscope having fluorescence observation function and filte...
Patent number
11,579,089
Issue date
Feb 14, 2023
Jasco Corporation
Kento Aizawa
G02 - OPTICS
Information
Patent Grant
Foreign matter analysis Method, storage medium storing foreign matt...
Patent number
11,248,962
Issue date
Feb 15, 2022
Jasco Corporation
Kento Aizawa
G01 - MEASURING TESTING
Information
Patent Grant
Microspectroscope having automatic sample detection function
Patent number
11,029,208
Issue date
Jun 8, 2021
Jasco Corporation
Kento Aizawa
G01 - MEASURING TESTING
Information
Patent Grant
Microspectroscope
Patent number
10,295,470
Issue date
May 21, 2019
Jasco Corporation
Kento Aizawa
G02 - OPTICS
Information
Patent Grant
Infrared microscope
Patent number
10,234,665
Issue date
Mar 19, 2019
Jasco Corporation
Kento Aizawa
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
ATTENUATED TOTAL REFLECTION MEASURING APPARATUS CAPABLE OF RAMAN SP...
Publication number
20230145637
Publication date
May 11, 2023
JASCO CORPORATION
Masateru USUKI
G01 - MEASURING TESTING
Information
Patent Application
FOREIGN MATTER ANALYSIS METHOD, STORAGE MEDIUM STORING FOREIGN MATT...
Publication number
20210247233
Publication date
Aug 12, 2021
JASCO CORPORATION
Kento AIZAWA
G01 - MEASURING TESTING
Information
Patent Application
RAMAN MICROSCOPE HAVING FLUORESCENCE OBSERVATION FUNCTION AND FILTE...
Publication number
20210190692
Publication date
Jun 24, 2021
JASCO CORPORATION
Kento AIZAWA
G02 - OPTICS
Information
Patent Application
MICROSPECTROSCOPE HAVING POSITION CORRECTION FUNCTION
Publication number
20200292802
Publication date
Sep 17, 2020
JASCO CORPORATION
Kento AIZAWA
G01 - MEASURING TESTING
Information
Patent Application
MICROSPECTROSCOPE HAVING AUTOMATIC SAMPLE DETECTION FUNCTION
Publication number
20200271522
Publication date
Aug 27, 2020
JASCO CORPORATION
Kento AIZAWA
G01 - MEASURING TESTING
Information
Patent Application
INFRARED MICROSCOPE
Publication number
20180307018
Publication date
Oct 25, 2018
JASCO CORPORATION
Kento AIZAWA
G02 - OPTICS
Information
Patent Application
MICROSPECTROSCOPE
Publication number
20180067053
Publication date
Mar 8, 2018
JASCO CORPORATION
Kento AIZAWA
G02 - OPTICS