Kento HORINOUCHI

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder, method for using sample holder, projection amount ad...
- Patent number 12,080,511
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask position adjustment method of ion milling, electron microscope...
- Patent number 10,269,534
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling apparatus and sample processing method
- Patent number 9,761,412
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Kento Horinouchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion Milling Apparatus
- Publication number 20240258062
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder, Method for Using Sample Holder, Projection Amount Ad...
- Publication number 20220319802
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Megumi NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask Position Adjustment Method of Ion Milling, Electron Microscope...
- Publication number 20180277335
- Publication date Sep 27, 2018
- Hitachi High-Technologies Corporation
- Toru IWAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Apparatus and Sample Processing Method
- Publication number 20170047198
- Publication date Feb 16, 2017
- Hitachi High-Technologies Corporation
- Kento HORINOUCHI
- G01 - MEASURING TESTING