Kenya Iwasaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature measurement substrate and temperature measurement system
- Patent number 11,035,741
- Issue date Jun 15, 2021
- Tokyo Electron Limited
- Tadashi Mitsunari
- G01 - MEASURING TESTING
Information Patent Grant
Method for separating and transferring IC chips
- Patent number 9,318,387
- Issue date Apr 19, 2016
- Tokyo Electron Limited
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for separating and transferring IC chips
- Patent number 9,196,539
- Issue date Nov 24, 2015
- Tokyo Electron Limited
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for separating and transferring IC chips
- Patent number 8,841,141
- Issue date Sep 23, 2014
- Tokyo Electron Limited
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for separating and transferring IC chips
- Patent number 8,658,436
- Issue date Feb 25, 2014
- Tokyo Electron Limited
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Worker management system, worker management apparatus and worker ma...
- Patent number 7,769,617
- Issue date Aug 3, 2010
- Tokyo Electron Limited
- Kenya Iwasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of processing substrate, and method of and program for manuf...
- Patent number 7,682,517
- Issue date Mar 23, 2010
- Tokyo Electron Limited
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing substrate, method of manufacturing solid-state...
- Patent number 7,622,392
- Issue date Nov 24, 2009
- Tokyo Electron Limited
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing substrate, post-chemical mechanical polishing...
- Patent number 7,510,972
- Issue date Mar 31, 2009
- Tokyo Electron Limited
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PLASMA PROCESSING APPARATUS
- Publication number 20210143044
- Publication date May 13, 2021
- TOKYO ELECTRON LIMITED
- Shinsuke OKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE MEASUREMENT SUBSTRATE AND TEMPERATURE MEASUREMENT SYSTEM
- Publication number 20190120703
- Publication date Apr 25, 2019
- TOKYO ELECTRON LIMITED
- Tadashi MITSUNARI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS
- Publication number 20160042999
- Publication date Feb 11, 2016
- TOKYO ELECTRON LIMITED
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPRINT DEVICE AND TEMPLATE
- Publication number 20150158242
- Publication date Jun 11, 2015
- TOKYO ELECTRON LIMITED
- Kenya Iwasaki
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS
- Publication number 20140370688
- Publication date Dec 18, 2014
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS
- Publication number 20140127839
- Publication date May 8, 2014
- TOKYO ELECTRON LIMITED
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS
- Publication number 20110281377
- Publication date Nov 17, 2011
- TOKYO ELECTRON LIMITED
- Masahiro Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of processing substrate, method of manufacturing solid-state...
- Publication number 20060191865
- Publication date Aug 31, 2006
- TOKYO ELECTRON LIMITED
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of processing substrate, and method of and program for manuf...
- Publication number 20060194435
- Publication date Aug 31, 2006
- TOKYO ELECTRON LIMITED
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of processing substrate, post-chemical mechanical polishing...
- Publication number 20060189138
- Publication date Aug 24, 2006
- TOKYO ELECTRON LIMITED
- Eiichi Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Worker management system, worker management apparatus and worker ma...
- Publication number 20050209902
- Publication date Sep 22, 2005
- Kenya Iwasaki
- G06 - COMPUTING CALCULATING COUNTING

Kenya Iwasaki

Person

Patents Grantslast 30 patents

Temperature measurement substrate and temperature measurement system

Method for separating and transferring IC chips

Method for separating and transferring IC chips

Method for separating and transferring IC chips

Method for separating and transferring IC chips

Worker management system, worker management apparatus and worker ma...

Method of processing substrate, and method of and program for manuf...

Method of processing substrate, method of manufacturing solid-state...

Method of processing substrate, post-chemical mechanical polishing...

Patents Applicationslast 30 patents

PLASMA PROCESSING APPARATUS

TEMPERATURE MEASUREMENT SUBSTRATE AND TEMPERATURE MEASUREMENT SYSTEM

METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS

IMPRINT DEVICE AND TEMPLATE

METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS

METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS

METHOD FOR SEPARATING AND TRANSFERRING IC CHIPS

Method of processing substrate, method of manufacturing solid-state...

Method of processing substrate, and method of and program for manuf...

Method of processing substrate, post-chemical mechanical polishing...

Worker management system, worker management apparatus and worker ma...