Kenya MATSUSHITA

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Patents Grantslast 30 patents

Information Patent Grant
Leakage current calculation device and leakage current calculation...
- Patent number 10,145,886
- Issue date Dec 4, 2018
- Tanashin Denki Co., Ltd.
- Kenya Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current calculation device and method for calculating leaka...
- Patent number 9,465,065
- Issue date Oct 11, 2016
- Tanashin Denki Co., Ltd.
- Kenya Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Signal generation device and signal generation method
- Patent number 9,013,156
- Issue date Apr 21, 2015
- Tanashin Denki Co., Ltd.
- Masakatsu Sawada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LEAKAGE CURRENT CALCULATION DEVICE AND LEAKAGE CURRENT CALCULATION...
- Publication number 20170307675
- Publication date Oct 26, 2017
- Tanashin Denki Co., Ltd.
- KENYA MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE CURRENT CALCULATION DEVICE AND METHOD FOR CALCULATING LEAKA...
- Publication number 20160124038
- Publication date May 5, 2016
- Tanashin Denki Co., Ltd.
- KENYA MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL GENERATION DEVICE AND SIGNAL GENERATION METHOD
- Publication number 20150054475
- Publication date Feb 26, 2015
- Tanashin Denki Co., Ltd.
- Masakatsu SAWADA
- G01 - MEASURING TESTING