Kenya Okazaki

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Patents Grantslast 30 patents

Information Patent Grant
Immersion objective lens, fluorometric analyzer, and inverted micro...
- Patent number 7,619,829
- Issue date Nov 17, 2009
- Olympus Corporation
- Kenya Okazaki
- G02 - OPTICS
Information Patent Grant
Measuring apparatus
- Patent number 7,369,220
- Issue date May 6, 2008
- Olympus Corporation
- Kenya Okazaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanner system and piezoelectric micro-inching mechansim used in sc...
- Patent number 6,437,343
- Issue date Aug 20, 2002
- Olympus Optical Co., Ltd.
- Kenya Okazaki
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND RECORDI...
- Publication number 20170017071
- Publication date Jan 19, 2017
- OLYMPUS CORPORATION
- Yoshihiro UE
- G02 - OPTICS
Information Patent Application
Measuring apparatus
- Publication number 20070103687
- Publication date May 10, 2007
- Kenya Okazaki
- G02 - OPTICS
Information Patent Application
Immersion objective lens, fluorometric analyzer, and inverted micro...
- Publication number 20060274424
- Publication date Dec 7, 2006
- OLYMPUS CORPORATION
- Kenya Okazaki
- G02 - OPTICS