Kenzo Hiraoka

Person

Kofu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion source, ion gun, and analysis instrument
- Patent number 9,372,161
- Issue date Jun 21, 2016
- ULVAC-PHI, INC.
- Daisuke Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Ionization method and apparatus using electrospray, and analyzing m...
- Patent number 9,111,739
- Issue date Aug 18, 2015
- University of Yamanashi
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting hydrogen peroxide
- Patent number 8,871,522
- Issue date Oct 28, 2014
- University of Yamanashi
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Ionization apparatus and ionization analysis apparatus
- Patent number 8,853,626
- Issue date Oct 7, 2014
- University of Yamanashi
- Kenzo Hiraoka
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ionization method and apparatus using a probe, and analytical metho...
- Patent number 8,450,682
- Issue date May 28, 2013
- University of Yamanashi
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization analysis method and apparatus
- Patent number 8,253,098
- Issue date Aug 28, 2012
- University of Yamanashi
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for selectively severing and analyzing non-cov...
- Patent number 8,030,090
- Issue date Oct 4, 2011
- University of Yamanashi
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Ionization method and apparatus using electrospray
- Patent number 7,902,499
- Issue date Mar 8, 2011
- University of Yamanashi
- Kenzo Hiraoka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ionization method and apparatus for mass analysis
- Patent number 7,465,920
- Issue date Dec 16, 2008
- University of Yamanashi
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of and apparatus for ionizing sample gas
- Patent number 7,091,493
- Issue date Aug 15, 2006
- Yamanashi TLO Co., Ltd.
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for treating a substrate with hydrogen radical...
- Patent number 6,472,299
- Issue date Oct 29, 2002
- Yamanashi Prefectural Federation of Societies of Commerce and Industry
- Kenzo Hiraoka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
IONIZATION DEVICE, MASS SPECTROMETRY SYSTEM, AND IONIZATION METHOD
- Publication number 20230187197
- Publication date Jun 15, 2023
- BIOCHROMATO, INC.
- Kazumasa KINOSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION GUN, AND ANALYSIS INSTRUMENT
- Publication number 20150206732
- Publication date Jul 23, 2015
- ULVAC-PHI, INC.
- Daisuke SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Ionization Apparatus and Ionization Analysis Apparatus
- Publication number 20140151550
- Publication date Jun 5, 2014
- UNIVERSITY OF YAMANASHI
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Application
Ionization apparatus and ionization analysis apparatus
- Publication number 20120292526
- Publication date Nov 22, 2012
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION METHOD AND APPARATUS USING ELECTROSPRAY, AND ANALYZING M...
- Publication number 20120248303
- Publication date Oct 4, 2012
- Kenzo HIRAOKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING HYDROGEN PEROXIDE
- Publication number 20110300636
- Publication date Dec 8, 2011
- UNIVERSITY OF YAMANASHI
- Kenzo HIRAOKA
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION METHOD AND APPARATUS USING A PROBE, AND ANALYTICAL METHO...
- Publication number 20110198495
- Publication date Aug 18, 2011
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION ANALYSIS METHOD AND APPARATUS
- Publication number 20110108726
- Publication date May 12, 2011
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION METHOD AND APPARATUS USING ELECTROSPRAY
- Publication number 20090140137
- Publication date Jun 4, 2009
- Kenzo Hiraoka
- G01 - MEASURING TESTING
Information Patent Application
Ionization Method and Apparatus for Mass Analysis
- Publication number 20080054176
- Publication date Mar 6, 2008
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ionization by cluster-ion impact
- Publication number 20070023678
- Publication date Feb 1, 2007
- Yamanashi TLO Co., Ltd.
- Kenzo Hiraoka
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Method of ionization by cluster ion bombardment and apparatus therefor
- Publication number 20060208741
- Publication date Sep 21, 2006
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of and apparatus for ionizing sample gas
- Publication number 20050001161
- Publication date Jan 6, 2005
- Kenzo Hiraoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process and apparatus for forming semiconductor thin film
- Publication number 20020037634
- Publication date Mar 28, 2002
- Kenzo Hiraoka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Kenzo Hiraoka

Person

Patents Grantslast 30 patents

Ion source, ion gun, and analysis instrument

Ionization method and apparatus using electrospray, and analyzing m...

Method for detecting hydrogen peroxide

Ionization apparatus and ionization analysis apparatus

Ionization method and apparatus using a probe, and analytical metho...

Ionization analysis method and apparatus

Method and apparatus for selectively severing and analyzing non-cov...

Ionization method and apparatus using electrospray

Ionization method and apparatus for mass analysis

Method of and apparatus for ionizing sample gas

Method and apparatus for treating a substrate with hydrogen radical...

Patents Applicationslast 30 patents

IONIZATION DEVICE, MASS SPECTROMETRY SYSTEM, AND IONIZATION METHOD

ION SOURCE, ION GUN, AND ANALYSIS INSTRUMENT

Ionization Apparatus and Ionization Analysis Apparatus

Ionization apparatus and ionization analysis apparatus

IONIZATION METHOD AND APPARATUS USING ELECTROSPRAY, AND ANALYZING M...

METHOD AND APPARATUS FOR DETECTING HYDROGEN PEROXIDE

IONIZATION METHOD AND APPARATUS USING A PROBE, AND ANALYTICAL METHO...

IONIZATION ANALYSIS METHOD AND APPARATUS

IONIZATION METHOD AND APPARATUS USING ELECTROSPRAY

Ionization Method and Apparatus for Mass Analysis

Method and apparatus for ionization by cluster-ion impact

Method of ionization by cluster ion bombardment and apparatus therefor

Method of and apparatus for ionizing sample gas

Process and apparatus for forming semiconductor thin film