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Kenzou Nakamura

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  • Omiya, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TEMPERATURE DETECTION CIRCUIT
    • Publication number 20190033142
    • Publication date Jan 31, 2019
    • MITSUBISHI MATERIALS CORPORATION
    • Masashi Nishiyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABNORMAL TEMPERATURE DETECTION CIRCUIT
    • Publication number 20180266894
    • Publication date Sep 20, 2018
    • MITSUBISHI MATERIALS CORPORATION
    • Masashi Nishiyama
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY