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Kerry P. Pfarr
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Rochester, MN, US
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Patents Grants
last 30 patents
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Patent Grant
Circuit for detecting structural defects in an integrated circuit c...
Patent number
9,599,664
Issue date
Mar 21, 2017
GLOBALFOUNDRIES Inc.
Luke D. Lacroix
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit for detecting structural defects in an integrated circuit c...
Patent number
9,057,760
Issue date
Jun 16, 2015
International Business Machines Corporation
Luke D. Lacroix
G01 - MEASURING TESTING
Information
Patent Grant
Method, apparatus and computer program product for implementing enh...
Patent number
6,917,900
Issue date
Jul 12, 2005
International Business Machines Corporation
Steven Paul Jones
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...
Publication number
20150247896
Publication date
Sep 3, 2015
International Business Machines Corporation
Luke D. Lacroix
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...
Publication number
20120187953
Publication date
Jul 26, 2012
International Business Machines Corporation
Luke D. LACROIX
G01 - MEASURING TESTING
Information
Patent Application
Method, apparatus and computer program product for implementing enh...
Publication number
20050060110
Publication date
Mar 17, 2005
International Business Machines Corporation
Steven Paul Jones
G01 - MEASURING TESTING