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Kerst GRIESBACH
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Dresden, DE
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last 30 patents
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Patent Grant
Thermopile test structure and methods employing same
Patent number
10,502,631
Issue date
Dec 10, 2019
X-FAB SEMICONDUCTOR FOUNDRIES GMBH
Peter Hofmann
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
THERMOPILE TEST STRUCTURE AND METHODS EMPLOYING SAME
Publication number
20170363477
Publication date
Dec 21, 2017
X-FAB SEMICONDUCTOR FOUNDRIES AG.
Peter HOFMANN
G01 - MEASURING TESTING