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Kerstin Purrucker
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Fliederweg, DE
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last 30 patents
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Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
Patent number
12,013,355
Issue date
Jun 18, 2024
KLA Corporation
David Y. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for measurement of thick films and high aspect...
Patent number
11,119,050
Issue date
Sep 14, 2021
KLA Corporation
Noam Sapiens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for measurement of thick films and high aspect...
Patent number
10,690,602
Issue date
Jun 23, 2020
KLA-Tencor Corporation
Noam Sapiens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical metrology with small illumination spot size
Patent number
10,648,796
Issue date
May 12, 2020
KLA-Tencor Corporation
Noam Sapiens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Simultaneous multi-angle spectroscopy
Patent number
9,921,104
Issue date
Mar 20, 2018
KLA-Tencor Corporation
Shankar Krishnan
G01 - MEASURING TESTING
Information
Patent Grant
Optical metrology with small illumination spot size
Patent number
9,915,524
Issue date
Mar 13, 2018
KLA-Tencor Corporation
Noam Sapiens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...
Publication number
20220196576
Publication date
Jun 23, 2022
KLA Corporation
David Y. Wang
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
Publication number
20200284733
Publication date
Sep 10, 2020
KLA Corporation
Noam Sapiens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
Publication number
20180238814
Publication date
Aug 23, 2018
KLA-Tencor Corporation
Noam Sapiens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optical Metrology With Small Illumination Spot Size
Publication number
20180180406
Publication date
Jun 28, 2018
KLA-Tencor Corporation
Noam Sapiens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Simultaneous Multi-Angle Spectroscopy
Publication number
20170356800
Publication date
Dec 14, 2017
KLA-Tencor Corporation
Shankar Krishnan
G01 - MEASURING TESTING
Information
Patent Application
Optical Metrology With Small Illumination Spot Size
Publication number
20160334326
Publication date
Nov 17, 2016
KLA-Tencor Corporation
Noam Sapiens
G01 - MEASURING TESTING