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Ketul B. Sutaria
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Hillsboro, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for early lifetime failure detection system
Patent number
11,662,376
Issue date
May 30, 2023
Intel Corporation
Ketul B. Sutaria
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for early lifetime failure detection system
Patent number
11,287,467
Issue date
Mar 29, 2022
Intel Corporation
Ketul B. Sutaria
G01 - MEASURING TESTING
Information
Patent Grant
On-die reliability monitor for integrated circuit
Patent number
11,099,232
Issue date
Aug 24, 2021
Intel Corporation
Suriya Ashok Kumar
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
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Patent Application
ADAPTIVE CLOCK GATING FOR IMPROVING WEAR OUT-INDUCED DUTY CYCLE SHI...
Publication number
20240235545
Publication date
Jul 11, 2024
Intel Corporation
Minki Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ADAPTIVE CLOCK GATING FOR IMPROVING WEAR OUT-INDUCED DUTY CYCLE SHI...
Publication number
20240137016
Publication date
Apr 25, 2024
Intel Corporation
Minki Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR EARLY LIFETIME FAILURE DETECTION SYSTEM
Publication number
20220221507
Publication date
Jul 14, 2022
Intel Corporation
Ketul B. Sutaria
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR EARLY LIFETIME FAILURE DETECTION SYSTEM
Publication number
20200408834
Publication date
Dec 31, 2020
Intel Corporation
Ketul B. Sutaria
G01 - MEASURING TESTING
Information
Patent Application
ON-DIE RELIABILITY MONITOR FOR INTEGRATED CIRCUIT
Publication number
20200249271
Publication date
Aug 6, 2020
Intel Corporation
Suriya Ashok Kumar
H03 - BASIC ELECTRONIC CIRCUITRY