Keung Hui

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for chemical mechanical polishing process control
- Patent number 10,096,482
- Issue date Oct 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabrication component retuning
- Patent number 9,323,244
- Issue date Apr 26, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Keung Hui
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor processing dispatch control
- Patent number 9,158,301
- Issue date Oct 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Chemical mechanical polish process control for improvement in withi...
- Patent number 9,132,523
- Issue date Sep 15, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shen-Nan Lee
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for target thickness and surface profile unifo...
- Patent number 9,102,033
- Issue date Aug 11, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- B24 - GRINDING POLISHING
Information Patent Grant
System and method of dosage profile control
- Patent number 8,925,479
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor processing dispatch control
- Patent number 8,781,614
- Issue date Jul 15, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method of dosage profile control
- Patent number 8,309,444
- Issue date Nov 13, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Scanning method and system using 2-D ion implanter
- Patent number 8,294,124
- Issue date Oct 23, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Keung Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing dispatch control
- Patent number 8,295,965
- Issue date Oct 23, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Chemical mechanical polish process control for improvement in withi...
- Patent number 8,129,279
- Issue date Mar 6, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shen-Nan Lee
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Chemical Mechanical Polishing Process Control
- Publication number 20150348797
- Publication date Dec 3, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FABRICATION COMPONENT RETUNING
- Publication number 20150081081
- Publication date Mar 19, 2015
- Taiwan Semiconductor Manufacturing Company Limited
- Keung Hui
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor Processing Dispatch Control
- Publication number 20140303765
- Publication date Oct 9, 2014
- Sunny Wu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
System and Method of Dosage Profile Control
- Publication number 20130068162
- Publication date Mar 21, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor Processing Dispatch Control
- Publication number 20130013097
- Publication date Jan 10, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Chemical Mechanical Polish Process Control for Improvement in Withi...
- Publication number 20120164918
- Publication date Jun 28, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shen-Nan Lee
- B24 - GRINDING POLISHING
Information Patent Application
APPARATUS AND METHOD FOR TARGET THICKNESS AND SURFACE PROFILE UNIFO...
- Publication number 20120129431
- Publication date May 24, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- KEUNG HUI
- B24 - GRINDING POLISHING
Information Patent Application
Semiconductor Processing Dispatch Control
- Publication number 20120016509
- Publication date Jan 19, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sunny Wu
- G05 - CONTROLLING REGULATING
Information Patent Application
System and Method of Dosage Profile Control
- Publication number 20120009692
- Publication date Jan 12, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keung Hui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SCANNING METHOD AND SYSTEM USING 2-D ION IIMPLANTER
- Publication number 20110174991
- Publication date Jul 21, 2011
- Taiwan Semiconductor Manufacturing Co., LTD
- Keung HUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chemical Mechanical Polish Process Control for Improvement in Withi...
- Publication number 20100093259
- Publication date Apr 15, 2010
- Shen-Nan Lee
- B24 - GRINDING POLISHING

Person

Patents Grantslast 30 patents

Apparatus and method for chemical mechanical polishing process control

Semiconductor fabrication component retuning

Semiconductor processing dispatch control

Chemical mechanical polish process control for improvement in withi...

Apparatus and method for target thickness and surface profile unifo...

System and method of dosage profile control

Semiconductor processing dispatch control

System and method of dosage profile control

Scanning method and system using 2-D ion implanter

Semiconductor processing dispatch control

Chemical mechanical polish process control for improvement in withi...

Patents Applicationslast 30 patents

Apparatus and Method for Chemical Mechanical Polishing Process Control

SEMICONDUCTOR FABRICATION COMPONENT RETUNING

Semiconductor Processing Dispatch Control

System and Method of Dosage Profile Control

Semiconductor Processing Dispatch Control

Chemical Mechanical Polish Process Control for Improvement in Withi...

APPARATUS AND METHOD FOR TARGET THICKNESS AND SURFACE PROFILE UNIFO...

Semiconductor Processing Dispatch Control

System and Method of Dosage Profile Control

SCANNING METHOD AND SYSTEM USING 2-D ION IIMPLANTER

Chemical Mechanical Polish Process Control for Improvement in Withi...