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Kevin Bocash
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Essex Junction, VT, US
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Patents Grants
last 30 patents
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Patent Grant
Probe-on-substrate
Patent number
9,057,741
Issue date
Jun 16, 2015
International Business Machines Corporation
David M. Audette
G01 - MEASURING TESTING
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Patent Grant
Probe-on-substrate
Patent number
8,933,717
Issue date
Jan 13, 2015
International Business Machines Corporation
David M. Audette
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE-ON-SUBSTRATE
Publication number
20130344694
Publication date
Dec 26, 2013
International Business Machines Corporation
David M. Audette
G01 - MEASURING TESTING
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Patent Application
PROBE-ON-SUBSTRATE
Publication number
20130342234
Publication date
Dec 26, 2013
Intenational Business Machines Corporation
David M. AUDETTE
G01 - MEASURING TESTING