Kevin Bocash

Person

  • Essex Junction, VT, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe-on-substrate

    • Patent number 9,057,741
    • Issue date Jun 16, 2015
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe-on-substrate

    • Patent number 8,933,717
    • Issue date Jan 13, 2015
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE-ON-SUBSTRATE

    • Publication number 20130344694
    • Publication date Dec 26, 2013
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE-ON-SUBSTRATE

    • Publication number 20130342234
    • Publication date Dec 26, 2013
    • Intenational Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING