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Kevin C. Brown
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Sunnyvale, CA, US
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last 30 patents
Information
Patent Grant
Silicon interconnect passivation and metallization process optimize...
Patent number
6,300,241
Issue date
Oct 9, 2001
National Semiconductor Corporation
Paul M. Moore
G02 - OPTICS
Information
Patent Grant
Method of wafer temperature measurement
Patent number
6,247,842
Issue date
Jun 19, 2001
National Semiconductor Corporation
Vassili M. Kitch
G01 - MEASURING TESTING
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Patent Grant
Interconnect passivation and metallization process optimized to max...
Patent number
6,190,936
Issue date
Feb 20, 2001
National Semiconductor Corp.
Paul McKay Moore
G02 - OPTICS
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Patent Grant
Plasma polymer antireflective coating
Patent number
5,443,941
Issue date
Aug 22, 1995
National Semiconductor Corporation
Anand J. Bariya
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY