KEVIN COLLAO

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ROSEDALE, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Cryogenic wafer test system
- Patent number 11,693,047
- Issue date Jul 4, 2023
- Northrop Grumman Systems Corporation
- Tessandra Anne Sage
- G01 - MEASURING TESTING
Information Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
- Patent number 11,639,957
- Issue date May 2, 2023
- Northrop Grumman Systems Corporation
- Kelsey McCusker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003788
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- TESSANDRA ANNE SAGE
- G01 - MEASURING TESTING
Information Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003791
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- KELSEY McCUSKER
- G01 - MEASURING TESTING