Kevin Cota

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to selectively identify reliability risk die based on charac...
- Patent number 7,390,680
- Issue date Jun 24, 2008
- LSI Corporation
- Ramon Gonzales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to selectively identify at risk die based on location within...
- Patent number 7,305,634
- Issue date Dec 4, 2007
- LSI Corporation
- Manu Rehani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting spatially correlated variations in a parameter...
- Patent number 6,943,042
- Issue date Sep 13, 2005
- LSI Logic Corporation
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to selectively identify reliability risk die based on charac...
- Patent number 6,880,140
- Issue date Apr 12, 2005
- LSI Logic Corporation
- Ramon Gonzales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive off tester screening method based on intrinsic die paramet...
- Patent number 6,807,655
- Issue date Oct 19, 2004
- LSI Logic Corporation
- Manu Rehani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting spatially correlated variations in a parameter...
- Patent number 6,787,379
- Issue date Sep 7, 2004
- LSI Logic Corporation
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistical decision system
- Patent number 6,782,500
- Issue date Aug 24, 2004
- LSI Logic Corporation
- Robert J. Madge
- G01 - MEASURING TESTING
Information Patent Grant
Test limits based on position
- Patent number 6,598,194
- Issue date Jul 22, 2003
- LSI Logic Corporation
- Robert J. Madge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method to selectively identify at risk die based on location within...
- Publication number 20060109462
- Publication date May 25, 2006
- Manu Rehani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method to selectively identify reliability risk die based on charac...
- Publication number 20050145841
- Publication date Jul 7, 2005
- LSI Logic Corporation
- Ramon Gonzales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to selectively identify reliability risk die based on charac...
- Publication number 20040249598
- Publication date Dec 9, 2004
- Ramon Gonzales
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of detecting spatially correlated variations in a parameter...
- Publication number 20040033635
- Publication date Feb 19, 2004
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method to selectively identify reliability risk die based on charac...

Method to selectively identify at risk die based on location within...

Method of detecting spatially correlated variations in a parameter...

Method to selectively identify reliability risk die based on charac...

Adaptive off tester screening method based on intrinsic die paramet...

Method of detecting spatially correlated variations in a parameter...

Statistical decision system

Test limits based on position

Patents Applicationslast 30 patents

Method to selectively identify at risk die based on location within...

Method to selectively identify reliability risk die based on charac...

Method to selectively identify reliability risk die based on charac...

Method of detecting spatially correlated variations in a parameter...