Kevin E. Moran

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Belmont, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
Particle detection system with reflective line-to-spot collector
- Patent number 5,448,364
- Issue date Sep 5, 1995
- Estek Corporation
- Kevin E. Moran
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low angle, high resolution surface inspection
- Patent number 5,127,726
- Issue date Jul 7, 1992
- Eastman Kodak Company
- Kevin E. Moran
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting reticles
- Patent number 4,875,780
- Issue date Oct 24, 1989
- Eastman Kodak Company
- Kevin E. Moran
- G01 - MEASURING TESTING
Information Patent Grant
Compact laser scanning system
- Patent number 4,630,276
- Issue date Dec 16, 1986
- Aeronca Electronics, Inc.
- Kevin E. Moran
- G01 - MEASURING TESTING