Kevin G. Stawiasz

Person

Bethel, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,102,090
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit to detect previous use of computer chips using passive test...
- Patent number 9,791,500
- Issue date Oct 17, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit to detect previous use of computer chips using passive test...
- Patent number 9,791,499
- Issue date Oct 17, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method for RAS-enabled and self-regulated frequency and...
- Patent number 8,729,920
- Issue date May 20, 2014
- International Business Machines Corporation
- Carole D. Graas
- G11 - INFORMATION STORAGE
Information Patent Grant
Digital interface for fast, inline, statistical characterization of...
- Patent number 8,587,288
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Azeez Jennudin Bhavnagarwala
- G01 - MEASURING TESTING
Information Patent Grant
On-chip characterization of noise-margins for memory arrays
- Patent number 7,768,848
- Issue date Aug 3, 2010
- International Business Machines Corporation
- Keith A. Jenkins
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...
- Publication number 20160341788
- Publication date Nov 24, 2016
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...
- Publication number 20150338454
- Publication date Nov 26, 2015
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR RAS-ENABLED AND SELF-REGULATED FREQUENCY AND...
- Publication number 20120126870
- Publication date May 24, 2012
- International Business Machines Corporation
- Carole D. GRAAS
- G01 - MEASURING TESTING
Information Patent Application
Digital Interface for Fast, Inline, Statistical Characterization of...
- Publication number 20110316569
- Publication date Dec 29, 2011
- International Business Machines Corporation
- Azeez Jennudin Bhavnagarwala
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP CHARACTERIZATION OF NOISE-MARGINS FOR MEMORY ARRAYS
- Publication number 20090116325
- Publication date May 7, 2009
- International Business Machines Corporation
- KEITH A. JENKINS
- G11 - INFORMATION STORAGE
Information Patent Application
MONITORING DEGRADATION OF CIRCIUT SPEED
- Publication number 20090063061
- Publication date Mar 5, 2009
- International Business Machines Corporation
- RONALD J. BOLAM
- G01 - MEASURING TESTING

Kevin G. Stawiasz

Person

Patents Grantslast 30 patents

Detection of performance degradation in integrated circuits

Non-destructive analysis to determine use history of processor

Non-destructive analysis to determine use history of processor

Circuit to detect previous use of computer chips using passive test...

Circuit to detect previous use of computer chips using passive test...

Circuit and method for RAS-enabled and self-regulated frequency and...

Digital interface for fast, inline, statistical characterization of...

On-chip characterization of noise-margins for memory arrays

Patents Applicationslast 30 patents

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...

CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...

CIRCUIT AND METHOD FOR RAS-ENABLED AND SELF-REGULATED FREQUENCY AND...

Digital Interface for Fast, Inline, Statistical Characterization of...

ON-CHIP CHARACTERIZATION OF NOISE-MARGINS FOR MEMORY ARRAYS

MONITORING DEGRADATION OF CIRCIUT SPEED