KEVIN G. WERHANE

Person

KUNA, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Asynchronous signal to command timing calibration for testing accuracy
- Patent number 11,955,160
- Issue date Apr 9, 2024
- Micron Technolgy, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods including dice latches in a semiconductor d...
- Patent number 11,727,967
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Yoshiro Riho
- G11 - INFORMATION STORAGE
Information Patent Grant
Serial interfaces with shadow registers, and associated systems, de...
- Patent number 11,675,589
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Kevin G. Werhane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for fuse error detection
- Patent number 11,645,134
- Issue date May 9, 2023
- Micron Technology, Inc.
- Daniel S. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interconnected command/address resources
- Patent number 11,342,042
- Issue date May 24, 2022
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses, systems, and methods for error correction
- Patent number 11,263,078
- Issue date Mar 1, 2022
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmit line monitoring circuitry, and related methods, devices, a...
- Patent number 11,183,260
- Issue date Nov 23, 2021
- Micron Technology Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device random option inversion
- Patent number 11,081,166
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Kevin G. Werhane
- G11 - INFORMATION STORAGE
Information Patent Grant
Segmented digital die ring
- Patent number 11,054,468
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Grant
Configurable associated repair addresses and circuitry for a memory...
- Patent number 10,984,884
- Issue date Apr 20, 2021
- Micron Technology, Inc.
- Christopher Gordon Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory read masking
- Patent number 10,930,327
- Issue date Feb 23, 2021
- Micron Technology, Inc.
- Dave Jefferson
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable post-package repair
- Patent number 10,825,544
- Issue date Nov 3, 2020
- Micron Technology, Inc.
- Christopher Gordon Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,663,513
- Issue date May 26, 2020
- Micron Technology, Inc.
- Kevin G. Werhane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single interconnect index pointer for stacked die address encoding
- Patent number 10,410,994
- Issue date Sep 10, 2019
- Micron Technology, Inc.
- Kevin Gustav Werhane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,330,726
- Issue date Jun 25, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST MODE SECURITY CIRCUIT
- Publication number 20240087625
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- Kari Crane
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...
- Publication number 20240071560
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
ASYNCHRONOUS SIGNAL TO COMMAND TIMING CALIBRATION FOR TESTING ACCURACY
- Publication number 20230420030
- Publication date Dec 28, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING DICE LATCHES IN A SEMICONDUCTOR D...
- Publication number 20230343376
- Publication date Oct 26, 2023
- Micron Technology, Inc.
- Yoshiro Riho
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS INCLUDING DICE LATCHES IN A SEMICONDUCTOR D...
- Publication number 20230223059
- Publication date Jul 13, 2023
- Micron Technology, Inc.
- Yoshiro Riho
- G11 - INFORMATION STORAGE
Information Patent Application
SERIAL INTERFACES WITH SHADOW REGISTERS, AND ASSOCIATED SYSTEMS, DE...
- Publication number 20230063588
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- Kevin G. Werhane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION
- Publication number 20220156148
- Publication date May 19, 2022
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERCONNECTED COMMAND/ADDRESS RESOURCES
- Publication number 20210304838
- Publication date Sep 30, 2021
- Micron Technology, Inc.
- Jason M. Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION
- Publication number 20210200629
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR FUSE ERROR DETECTION
- Publication number 20210055981
- Publication date Feb 25, 2021
- Micron Technology, Inc.
- Daniel S. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE ASSOCIATED REPAIR ADDRESSES AND CIRCUITRY FOR A MEMORY...
- Publication number 20200335175
- Publication date Oct 22, 2020
- Micron Technology, Inc.
- Christopher Gordon Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Application
CONFIGURABLE POST-PACKAGE REPAIR
- Publication number 20200219581
- Publication date Jul 9, 2020
- Micron Technology, Inc.
- Christopher Gordon Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Application
SEGMENTED DIGITAL DIE RING
- Publication number 20190369163
- Publication date Dec 5, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...
- Publication number 20190271739
- Publication date Sep 5, 2019
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
SINGLE INTERCONNECT INDEX POINTER FOR STACKED DIE ADDRESS ENCODING
- Publication number 20190086469
- Publication date Mar 21, 2019
- Micron Technology, Inc.
- Kevin Gustav Werhane
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...
- Publication number 20180364303
- Publication date Dec 20, 2018
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING

KEVIN G. WERHANE

Person

Patents Grantslast 30 patents

Asynchronous signal to command timing calibration for testing accuracy

Apparatuses and methods including dice latches in a semiconductor d...

Serial interfaces with shadow registers, and associated systems, de...

Apparatuses and methods for fuse error detection

Interconnected command/address resources

Apparatuses, systems, and methods for error correction

Transmit line monitoring circuitry, and related methods, devices, a...

Memory device random option inversion

Segmented digital die ring

Configurable associated repair addresses and circuitry for a memory...

Memory read masking

Configurable post-package repair

Apparatuses including test segment circuits having latch circuits f...

Single interconnect index pointer for stacked die address encoding

Apparatuses including test segment circuits having latch circuits f...

Patents Applicationslast 30 patents

TEST MODE SECURITY CIRCUIT

SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...

ASYNCHRONOUS SIGNAL TO COMMAND TIMING CALIBRATION FOR TESTING ACCURACY

APPARATUSES AND METHODS INCLUDING DICE LATCHES IN A SEMICONDUCTOR D...

APPARATUSES AND METHODS INCLUDING DICE LATCHES IN A SEMICONDUCTOR D...

SERIAL INTERFACES WITH SHADOW REGISTERS, AND ASSOCIATED SYSTEMS, DE...

APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

INTERCONNECTED COMMAND/ADDRESS RESOURCES

APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

APPARATUSES AND METHODS FOR FUSE ERROR DETECTION

CONFIGURABLE ASSOCIATED REPAIR ADDRESSES AND CIRCUITRY FOR A MEMORY...

CONFIGURABLE POST-PACKAGE REPAIR

SEGMENTED DIGITAL DIE RING

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...

SINGLE INTERCONNECT INDEX POINTER FOR STACKED DIE ADDRESS ENCODING

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...