Kevin Kjoller

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 11,714,103
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
- Patent number 11,680,892
- Issue date Jun 20, 2023
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
- Patent number 11,002,665
- Issue date May 11, 2021
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sub-diffraction infrared imaging and spect...
- Patent number 10,969,405
- Issue date Apr 6, 2021
- Photothermal Spectroscopy Corp.
- Roshan Shetty
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhanced photo-thermal imaging and spectro...
- Patent number 10,942,116
- Issue date Mar 9, 2021
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 10,914,755
- Issue date Feb 9, 2021
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale infrared spectroscopy with multi-frequency atomic force m...
- Patent number 10,557,789
- Issue date Feb 11, 2020
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 10,228,388
- Issue date Mar 12, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 10,082,523
- Issue date Sep 25, 2018
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,778,282
- Issue date Oct 3, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 9,658,247
- Issue date May 23, 2017
- Anasys Instruments
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple modulation heterodyne infrared spectroscopy
- Patent number 9,134,341
- Issue date Sep 15, 2015
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,869,602
- Issue date Oct 28, 2014
- Anasys Instruments Corp.
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning probe microscope and method of manufacture
- Patent number 8,857,247
- Issue date Oct 14, 2014
- Bruker Nano, Inc.
- Kevin J. Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption with a modul...
- Patent number 8,680,467
- Issue date Mar 25, 2014
- Anasys Instruments Corp.
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic power control for nanoscale spectroscopy
- Patent number 8,646,319
- Issue date Feb 11, 2014
- Anasys Instruments Corp.
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,607,622
- Issue date Dec 17, 2013
- Anasys Instruments Corporation
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,418,538
- Issue date Apr 16, 2013
- Anasys Instruments Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,402,819
- Issue date Mar 26, 2013
- Anasys Instruments, Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microcantilever with reduced second harmonic while in contact with...
- Patent number 8,387,443
- Issue date Mar 5, 2013
- The Board of Trustees of the University of Illinois
- William P. King
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic power control, beam alignment and focus for nanoscale spect...
- Patent number 8,242,448
- Issue date Aug 14, 2012
- Anasys Instruments Corporation
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transition temperature microscopy
- Patent number 8,177,422
- Issue date May 15, 2012
- Anasys Instruments
- Kevin Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,001,830
- Issue date Aug 23, 2011
- Anasys Instruments, Inc.
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Quantitative calorimetry signal for sub-micron scale thermal analysis
- Patent number 7,665,889
- Issue date Feb 23, 2010
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of manipulating a sample
- Patent number 7,334,460
- Issue date Feb 26, 2008
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electrochemical potential microscope
- Patent number 7,156,965
- Issue date Jan 2, 2007
- Veeco Instruments Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manipulating a sample
- Patent number 7,040,147
- Issue date May 9, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manipulating a sample
- Patent number 6,862,921
- Issue date Mar 8, 2005
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining improved vertical metrology meas...
- Patent number 5,898,106
- Issue date Apr 27, 1999
- Digital Instruments, Inc.
- Kenneth L. Babcock
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IMPROVED COMPOSITE MULTI-WAVELENGTH PHOTOT...
- Publication number 20240280477
- Publication date Aug 22, 2024
- Photothermal Spectroscopy Corp.
- Craig Prater
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
- Publication number 20230236112
- Publication date Jul 27, 2023
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
- Publication number 20220065772
- Publication date Mar 3, 2022
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
- Publication number 20210165019
- Publication date Jun 3, 2021
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
- Publication number 20200217874
- Publication date Jul 9, 2020
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
- Publication number 20200025677
- Publication date Jan 23, 2020
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
- Publication number 20190391177
- Publication date Dec 26, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...
- Publication number 20190120753
- Publication date Apr 25, 2019
- Photothermal Spectroscopy Corp.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
- Publication number 20190011358
- Publication date Jan 10, 2019
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20180203039
- Publication date Jul 19, 2018
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RAPID SUB-DIFFRACTION INFRARED IMAGING AND...
- Publication number 20180180642
- Publication date Jun 28, 2018
- Anaysis Instruments Corp.
- Roshan Shetty
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...
- Publication number 20180120344
- Publication date May 3, 2018
- ANASYS INSTRUMENTS
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170219622
- Publication date Aug 3, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Infrared Scattering Scanning Near-field Op...
- Publication number 20170003316
- Publication date Jan 5, 2017
- ANASYS INSTRUMENTS
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale infrared spectroscopy with multi-frequency atomic force m...
- Publication number 20150034826
- Publication date Feb 5, 2015
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Deflection Measurement of IR Absorption with a Modul...
- Publication number 20130036521
- Publication date Feb 7, 2013
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple modulation heterodyne infrared spectroscopy
- Publication number 20120204296
- Publication date Aug 9, 2012
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Deflection Measurement of IR Absorption
- Publication number 20120167261
- Publication date Jun 28, 2012
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Deflection Measurement of IR Absorption
- Publication number 20120050718
- Publication date Mar 1, 2012
- A. Dazzi Dazzi
- G01 - MEASURING TESTING
Information Patent Application
High frequency deflection measurement of IR absorption
- Publication number 20110283428
- Publication date Nov 17, 2011
- A. Dazzi Dazzi
- G01 - MEASURING TESTING
Information Patent Application
Dynamic power control for nanoscale spectroscopy
- Publication number 20110203357
- Publication date Aug 25, 2011
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Dynamic power control, beam alignment and focus for nanoscale spect...
- Publication number 20110205527
- Publication date Aug 25, 2011
- Anasys Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Microcantilever with Reduced Second Harmonic While in Contact with...
- Publication number 20110061452
- Publication date Mar 17, 2011
- William P. King
- G01 - MEASURING TESTING
Information Patent Application
Transition temperature microscopy
- Publication number 20100042356
- Publication date Feb 18, 2010
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
High frequency deflection measurement of IR absorption
- Publication number 20090249521
- Publication date Oct 1, 2009
- A. Dazzi Dazzi
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE
- Publication number 20080282819
- Publication date Nov 20, 2008
- Veeco Instruments Inc.
- Kevin J. Kjoller
- G01 - MEASURING TESTING
Information Patent Application
High frequency deflection measurement of IR absorption
- Publication number 20080283755
- Publication date Nov 20, 2008
- A. Dazzi Dazzi
- G01 - MEASURING TESTING
Information Patent Application
Quantitative calorimetry signal for sub-micron scale thermal analysis
- Publication number 20070263696
- Publication date Nov 15, 2007
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF MANIPULATING A SAMPLE
- Publication number 20060243034
- Publication date Nov 2, 2006
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning probe microscope and method of manufacture
- Publication number 20060213289
- Publication date Sep 28, 2006
- Kevin J. Kjoller
- G01 - MEASURING TESTING

Kevin Kjoller

Person

Patents Grantslast 30 patents

Method and apparatus for resolution and sensitivity enhanced atomic...

Method and apparatus for enhanced photo-thermal imaging and spectro...

Surface sensitive atomic force microscope based infrared spectroscopy

Method and apparatus for enhanced photo-thermal imaging and spectro...

Method and apparatus for sub-diffraction infrared imaging and spect...

Method and apparatus for enhanced photo-thermal imaging and spectro...

Method and apparatus for resolution and sensitivity enhanced atomic...

Nanoscale infrared spectroscopy with multi-frequency atomic force m...

Method and apparatus for resolution and sensitivity enhanced atomic...

Method and apparatus for infrared scattering scanning near-field op...

Method and apparatus for infrared scattering scanning near-field op...

Method and apparatus for infrared scattering scanning near-field op...

Multiple modulation heterodyne infrared spectroscopy

High frequency deflection measurement of IR absorption

Probe for a scanning probe microscope and method of manufacture

High frequency deflection measurement of IR absorption with a modul...

Dynamic power control for nanoscale spectroscopy

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

Microcantilever with reduced second harmonic while in contact with...

Dynamic power control, beam alignment and focus for nanoscale spect...

Transition temperature microscopy

High frequency deflection measurement of IR absorption

Quantitative calorimetry signal for sub-micron scale thermal analysis

Method and apparatus of manipulating a sample

Scanning electrochemical potential microscope

Method and apparatus for manipulating a sample

Method and apparatus for manipulating a sample

Method and apparatus for obtaining improved vertical metrology meas...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR IMPROVED COMPOSITE MULTI-WAVELENGTH PHOTOT...

METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...

METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...

Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...

Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy

METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...

Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...

METHOD AND APPARATUS FOR ENHANCED PHOTO-THERMAL IMAGING AND SPECTRO...

Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

METHOD AND APPARATUS FOR RAPID SUB-DIFFRACTION INFRARED IMAGING AND...

METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Method and Apparatus for Infrared Scattering Scanning Near-field Op...

Nanoscale infrared spectroscopy with multi-frequency atomic force m...

High Frequency Deflection Measurement of IR Absorption with a Modul...

Multiple modulation heterodyne infrared spectroscopy

High Frequency Deflection Measurement of IR Absorption

High Frequency Deflection Measurement of IR Absorption

High frequency deflection measurement of IR absorption

Dynamic power control for nanoscale spectroscopy

Dynamic power control, beam alignment and focus for nanoscale spect...

Microcantilever with Reduced Second Harmonic While in Contact with...

Transition temperature microscopy

High frequency deflection measurement of IR absorption

PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE

High frequency deflection measurement of IR absorption

Quantitative calorimetry signal for sub-micron scale thermal analysis

METHOD AND APPARATUS OF MANIPULATING A SAMPLE

Probe for a scanning probe microscope and method of manufacture