Kevin Lensing

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for extracting dose and focus from critical di...
- Patent number 8,149,384
- Issue date Apr 3, 2012
- Advanced Micro Devices, Inc.
- Siddharth Chauhan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining die test protocols based on process health
- Patent number 8,041,518
- Issue date Oct 18, 2011
- GLOBALFOUNDRIES Inc.
- Michael G. McIntyre
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for employing previous test insertion results...
- Patent number 7,983,871
- Issue date Jul 19, 2011
- Advanced Micro Devices, Inc.
- Douglas C. Kimbrough
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optimizing models for extracting dose and...
- Patent number 7,925,369
- Issue date Apr 12, 2011
- GLOBALFOUNDRIES Inc.
- Siddharth Chauhan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of controlling embedded material/gate proximity
- Patent number 7,838,308
- Issue date Nov 23, 2010
- Advanced Micro Devices, Inc.
- Rohit Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for implementing scaled device tests
- Patent number 7,822,567
- Issue date Oct 26, 2010
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for compensating metrology data for site bias...
- Patent number 7,738,986
- Issue date Jun 15, 2010
- GLOBALFOUNDRIES, INC.
- James Broc Stirton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for matching test equipment calibration
- Patent number 7,716,004
- Issue date May 11, 2010
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Methods for calibrating a process for growing an epitaxial silicon...
- Patent number 7,682,845
- Issue date Mar 23, 2010
- GlobalFoundries Inc.
- Rohit Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for integrating multiple sample plans
- Patent number 7,519,447
- Issue date Apr 14, 2009
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for dynamic adjustment of sensor and/or metrol...
- Patent number 7,502,702
- Issue date Mar 10, 2009
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a root cause of a statistical...
- Patent number 7,337,034
- Issue date Feb 26, 2008
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for comparing device and non-device structures
- Patent number 7,282,374
- Issue date Oct 16, 2007
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for classifying faults based on wafer state da...
- Patent number 7,277,824
- Issue date Oct 2, 2007
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining grid dimensions using scattero...
- Patent number 7,262,864
- Issue date Aug 28, 2007
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating a polishing process endpoint si...
- Patent number 6,980,300
- Issue date Dec 27, 2005
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- B24 - GRINDING POLISHING
Information Patent Grant
Method of monitoring anneal processes using scatterometry, and syst...
- Patent number 6,933,158
- Issue date Aug 23, 2005
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Structures for analyzing electromigration, and methods of using same
- Patent number 6,927,080
- Issue date Aug 9, 2005
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- G01 - MEASURING TESTING
Information Patent Grant
Method of using scatterometry for analysis of electromigration, and...
- Patent number 6,881,594
- Issue date Apr 19, 2005
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining contact opening dimensions usi...
- Patent number 6,804,014
- Issue date Oct 12, 2004
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method of using high yielding spectra scatterometry measurements to...
- Patent number 6,785,009
- Issue date Aug 31, 2004
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying misregistration in a complimen...
- Patent number 6,774,998
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for detecting necking over field/active transi...
- Patent number 6,766,215
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method of correcting non-linearity of metrology tools, and system f...
- Patent number 6,746,882
- Issue date Jun 8, 2004
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing overlay measurements using scat...
- Patent number 6,716,646
- Issue date Apr 6, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using scatterometry measurements to control photoresist e...
- Patent number 6,707,562
- Issue date Mar 16, 2004
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring implant profiles using scatterometric technique...
- Patent number 6,660,543
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting necking over field/active transi...
- Patent number 6,657,716
- Issue date Dec 2, 2003
- Advanced Micro Devices Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining column dimensions using scatte...
- Patent number 6,650,423
- Issue date Nov 18, 2003
- Advanced Micro Devices Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting degradation in photolithography processes based...
- Patent number 6,643,008
- Issue date Nov 4, 2003
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF CONTROLLING EMBEDDED MATERIAL/GATE PROXIMITY
- Publication number 20090280579
- Publication date Nov 12, 2009
- Advanced Micro Devices, Inc.
- Rohit Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING STRESSED LAYER GATE PROXIMITY
- Publication number 20090228132
- Publication date Sep 10, 2009
- Kevin R. Lensing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CALIBRATING A PROCESS FOR GROWING AN EPITAXIAL SILICON...
- Publication number 20090170223
- Publication date Jul 2, 2009
- Advanced Micro Devices, Inc.
- Rohit PAL
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZING MODELS FOR EXTRACTING DOSE AND...
- Publication number 20090157577
- Publication date Jun 18, 2009
- Siddharth Chauhan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR EXTRACTING DOSE AND FOCUS FROM CRITICAL DI...
- Publication number 20090153818
- Publication date Jun 18, 2009
- Siddharth Chauhan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MONITORING OPTICAL PROXIMITY CORRECTION PE...
- Publication number 20090144692
- Publication date Jun 4, 2009
- Jason P. Cain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MONITORING MARGINAL LAYOUT DESIGN RULES
- Publication number 20090144686
- Publication date Jun 4, 2009
- KEVIN R. LENSING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR EMPLOYING PREVIOUS TEST INSERTION RESULTS...
- Publication number 20090058449
- Publication date Mar 5, 2009
- Douglas C. Kimbrough
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for matching test equipment calibration
- Publication number 20090012730
- Publication date Jan 8, 2009
- ELFIDO COSS, JR.
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPLEMENTING SCALED DEVICE TESTS
- Publication number 20090006021
- Publication date Jan 1, 2009
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING DIE TEST PROTOCOLS BASED ON PROCESS HEALTH
- Publication number 20080281545
- Publication date Nov 13, 2008
- Michael G. McIntyre
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Compensating Metrology Data for Site Bias...
- Publication number 20080147224
- Publication date Jun 19, 2008
- James Broc Stirton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for calibrating integrated metrology systems and...
- Publication number 20060058979
- Publication date Mar 16, 2006
- Richard J. Markle
- H01 - BASIC ELECTRIC ELEMENTS

Kevin Lensing

Person

Patents Grantslast 30 patents

Method and apparatus for extracting dose and focus from critical di...

Determining die test protocols based on process health

Method and apparatus for employing previous test insertion results...

Method and apparatus for optimizing models for extracting dose and...

Method of controlling embedded material/gate proximity

Method and apparatus for implementing scaled device tests

Method and apparatus for compensating metrology data for site bias...

Method and apparatus for matching test equipment calibration

Methods for calibrating a process for growing an epitaxial silicon...

Method and apparatus for integrating multiple sample plans

Method and apparatus for dynamic adjustment of sensor and/or metrol...

Method and apparatus for determining a root cause of a statistical...

Method and apparatus for comparing device and non-device structures

Method and apparatus for classifying faults based on wafer state da...

Method and apparatus for determining grid dimensions using scattero...

Method and apparatus for generating a polishing process endpoint si...

Method of monitoring anneal processes using scatterometry, and syst...

Structures for analyzing electromigration, and methods of using same

Method of using scatterometry for analysis of electromigration, and...

Method and apparatus for determining contact opening dimensions usi...

Method of using high yielding spectra scatterometry measurements to...

Method and apparatus for identifying misregistration in a complimen...

Method and apparatus for detecting necking over field/active transi...

Method of correcting non-linearity of metrology tools, and system f...

Method and apparatus for performing overlay measurements using scat...

Method of using scatterometry measurements to control photoresist e...

Method of measuring implant profiles using scatterometric technique...

Method and apparatus for detecting necking over field/active transi...

Method and apparatus for determining column dimensions using scatte...

Method of detecting degradation in photolithography processes based...

Patents Applicationslast 30 patents

METHOD OF CONTROLLING EMBEDDED MATERIAL/GATE PROXIMITY

METHOD AND APPARATUS FOR CONTROLLING STRESSED LAYER GATE PROXIMITY

METHODS FOR CALIBRATING A PROCESS FOR GROWING AN EPITAXIAL SILICON...

METHOD AND APPARATUS FOR OPTIMIZING MODELS FOR EXTRACTING DOSE AND...

METHOD AND APPARATUS FOR EXTRACTING DOSE AND FOCUS FROM CRITICAL DI...

METHOD AND APPARATUS FOR MONITORING OPTICAL PROXIMITY CORRECTION PE...

METHOD AND APPARATUS FOR MONITORING MARGINAL LAYOUT DESIGN RULES

METHOD AND APPARATUS FOR EMPLOYING PREVIOUS TEST INSERTION RESULTS...

Method and apparatus for matching test equipment calibration

METHOD AND APPARATUS FOR IMPLEMENTING SCALED DEVICE TESTS

DETERMINING DIE TEST PROTOCOLS BASED ON PROCESS HEALTH

Method and Apparatus for Compensating Metrology Data for Site Bias...

Method and system for calibrating integrated metrology systems and...