Kevin Liu

Follow

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 11,043,356
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 10,497,538
- Issue date Dec 3, 2019
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Local alignment point calibration method in die inspection
- Patent number 9,953,803
- Issue date Apr 24, 2018
- Hermes Microvision Inc.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20200105497
- Publication date Apr 2, 2020
- ASML NETHERLANDS B.V.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20180247789
- Publication date Aug 30, 2018
- Hermes Microvision Inc.
- Wei FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Local Alignment Point Calibration Method in Die Inspection
- Publication number 20160247660
- Publication date Aug 25, 2016
- HERMES MICROVISION INC.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS