KEVIN MAJERUS

Person

BOISE, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods for repairing defective memory cells based...
- Patent number 11,984,186
- Issue date May 14, 2024
- Micron Technology, Inc.
- David Hulton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charge leakage detection for memory system reliability
- Patent number 11,749,330
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Angelo Visconti
- G11 - INFORMATION STORAGE
Information Patent Grant
Quick activate for memory sensing
- Patent number 11,740,814
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Kevin T. Majerus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quick precharge for memory sensing
- Patent number 11,626,150
- Issue date Apr 11, 2023
- Micron Technology, Inc.
- Kevin T. Majerus
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge leakage detection for memory system reliability
- Patent number 11,514,968
- Issue date Nov 29, 2022
- Micron Technology, Inc.
- Angelo Visconti
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for repairing defective memory cells based...
- Patent number 11,183,266
- Issue date Nov 23, 2021
- Micron Technology, Inc.
- David Hulton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quick precharge for memory sensing
- Patent number 11,139,014
- Issue date Oct 5, 2021
- Micron Technology, Inc.
- Kevin T. Majerus
- G11 - INFORMATION STORAGE
Information Patent Grant
Quick activate for memory sensing
- Patent number 11,079,949
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Kevin T. Majerus
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGE LEAKAGE DETECTION FOR MEMORY SYSTEM RELIABILITY
- Publication number 20230114735
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Angelo Visconti
- G11 - INFORMATION STORAGE
Information Patent Application
QUICK PRECHARGE FOR MEMORY SENSING
- Publication number 20220084577
- Publication date Mar 17, 2022
- Micron Technology, Inc.
- Kevin T. Majerus
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...
- Publication number 20220068430
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- DAVID HULTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUICK ACTIVATE FOR MEMORY SENSING
- Publication number 20220011957
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Kevin T. Majerus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE LEAKAGE DETECTION FOR MEMORY SYSTEM RELIABILITY
- Publication number 20210304805
- Publication date Sep 30, 2021
- Micron Technology, Inc.
- Angelo Visconti
- G11 - INFORMATION STORAGE
Information Patent Application
QUICK ACTIVATE FOR MEMORY SENSING
- Publication number 20210149573
- Publication date May 20, 2021
- Micron Technology, Inc.
- Kevin T. Majerus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUICK PRECHARGE FOR MEMORY SENSING
- Publication number 20210134340
- Publication date May 6, 2021
- Micron Technology, Inc.
- Kevin T. Majerus
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...
- Publication number 20200411132
- Publication date Dec 31, 2020
- Micron Technology, Inc.
- DAVID HULTON
- G06 - COMPUTING CALCULATING COUNTING

KEVIN MAJERUS

Person

Patents Grantslast 30 patents

Apparatuses and methods for repairing defective memory cells based...

Charge leakage detection for memory system reliability

Quick activate for memory sensing

Quick precharge for memory sensing

Charge leakage detection for memory system reliability

Apparatuses and methods for repairing defective memory cells based...

Quick precharge for memory sensing

Quick activate for memory sensing

Patents Applicationslast 30 patents

CHARGE LEAKAGE DETECTION FOR MEMORY SYSTEM RELIABILITY

QUICK PRECHARGE FOR MEMORY SENSING

APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...

QUICK ACTIVATE FOR MEMORY SENSING

CHARGE LEAKAGE DETECTION FOR MEMORY SYSTEM RELIABILITY

QUICK ACTIVATE FOR MEMORY SENSING

QUICK PRECHARGE FOR MEMORY SENSING

APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...