Kevin Matney

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Aurora, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Image contrast in X-ray topography imaging for defect inspection
- Patent number 10,816,487
- Issue date Oct 27, 2020
- BRUKER TECHNOLOGIES LTD.
- Kevin Monroe Matney
- G01 - MEASURING TESTING
Information Patent Grant
Fitting of X-ray scattering data using evolutionary algorithms
- Patent number 6,192,103
- Issue date Feb 20, 2001
- Bede Scientific, Inc.
- Matthew Wormington
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Image contrast in X-Ray topography imaging for defect inspection
- Publication number 20190317028
- Publication date Oct 17, 2019
- BRUKER JV ISRAEL LTD.
- Kevin Monroe Matney
- G01 - MEASURING TESTING
Information Patent Application
Positioning apparatus
- Publication number 20060159229
- Publication date Jul 20, 2006
- Bede Scientific Instruments Limited
- David K. Bowen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining a parameter of a sample
- Publication number 20040131152
- Publication date Jul 8, 2004
- Bede plc
- Simon Bates
- G01 - MEASURING TESTING