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Patents Grants
last 30 patents
Information
Patent Grant
Short-wave infra-red radiation detection device
Patent number
12,107,183
Issue date
Oct 1, 2024
PixQuanta Limited
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor photomultiplier
Patent number
11,239,382
Issue date
Feb 1, 2022
SensL Technologies Ltd.
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic radiation detection device
Patent number
10,718,873
Issue date
Jul 21, 2020
Pixquanta Limited
Kevin O'Neill
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Semiconductor photomultiplier with baseline restoration for a fast...
Patent number
10,302,778
Issue date
May 28, 2019
SensL Technologies Ltd.
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process of manufacturing an avalanche diode
Patent number
10,290,760
Issue date
May 14, 2019
SensL Technologies Ltd.
Kevin Michael O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor photomultiplier and a process of manufacturing a phot...
Patent number
10,121,928
Issue date
Nov 6, 2018
SensL Technologies Ltd.
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Avalanche diode, and a process of manufacturing an avalanche diode
Patent number
10,043,936
Issue date
Aug 7, 2018
Semiconductor Components Industries, LLC
Kevin Michael O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor photomultiplier with baseline restoration for a fast...
Patent number
9,939,536
Issue date
Apr 10, 2018
Sensi Technologies Ltd.
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor photomultiplier and readout method
Patent number
9,634,156
Issue date
Apr 25, 2017
Sensl Technologies Ltd.
Nikolai Pavlov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor photomultiplier
Patent number
9,437,630
Issue date
Sep 6, 2016
SensL Technologies Ltd.
Liam Wall
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SHORT-WAVE INFRA-RED RADIATION DETECTION DEVICE
Publication number
20250022978
Publication date
Jan 16, 2025
PixQuanta Limited
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SHORT-WAVE INFRA-RED RADIATION DETECTION DEVICE
Publication number
20220344529
Publication date
Oct 27, 2022
PixQuanta Limited
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMAGNETIC RADIATION DETECTION DEVICE
Publication number
20190146100
Publication date
May 16, 2019
Pixquanta Limited
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER
Publication number
20190044019
Publication date
Feb 7, 2019
SensL Technologies Ltd
Kevin O'NEILL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESS OF MANUFACTURING AN AVALANCHE DIODE
Publication number
20180309012
Publication date
Oct 25, 2018
SENSL TECHNOLOGIES LTD.
Kevin Michael O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER WITH BASELINE RESTORATION FOR A FAST...
Publication number
20180217278
Publication date
Aug 2, 2018
SENSL TECHNOLOGIES LTD.
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER WITH BASELINE RESTORATION FOR A FAST...
Publication number
20170242136
Publication date
Aug 24, 2017
SENSL TECHNOLOGIES LTD.
Kevin O'Neill
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER AND A PROCESS OF MANUFACTURING A PHOT...
Publication number
20160005913
Publication date
Jan 7, 2016
SensL Technologies Ltd
Kevin O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER
Publication number
20150340390
Publication date
Nov 26, 2015
SensL Technologies Ltd
Liam Wall
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PHOTOMULTIPLIER AND READOUT METHOD
Publication number
20130313414
Publication date
Nov 28, 2013
NIKOLAI PAVLOV
G01 - MEASURING TESTING