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Kevin T. Wu
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Hopewell Junction, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Method of inspecting a semiconductor substrate
Patent number
9,390,884
Issue date
Jul 12, 2016
GLOBALFOUNDRIES Inc.
Eric C. Harley
G01 - MEASURING TESTING
Information
Patent Grant
Robust inspection alignment of semiconductor inspection tools using...
Patent number
8,750,597
Issue date
Jun 10, 2014
International Business Machines Corporation
Oliver D. Patterson
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR INSPECTION SYSTEM INCLUDING REFERENCE IMAGE GENERATOR
Publication number
20150325406
Publication date
Nov 12, 2015
International Business Machines Corporation
Eric C. Harley
G01 - MEASURING TESTING
Information
Patent Application
ROBUST INSPECTION ALIGNMENT OF SEMICONDUCTOR INSPECTION TOOLS USING...
Publication number
20130129189
Publication date
May 23, 2013
International Business Machines Corporation
Kevin T. Wu
G06 - COMPUTING CALCULATING COUNTING