Kevin VAN DE RUIT

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining a set of metrology points on a substrate, ass...
- Patent number 11,435,673
- Issue date Sep 6, 2022
- ASML Netherlands B.V.
- Kevin Van De Ruit
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and lithographic projection method
- Patent number 10,459,354
- Issue date Oct 29, 2019
- ASML Netherlands B.V.
- Kevin Van De Ruit
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING A SET OF METROLOGY POINTS ON A SUBSTRATE, ASS...
- Publication number 20220155698
- Publication date May 19, 2022
- ASML NETHERLANDS B.V.
- Kevin VAN DE RUIT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING PELLICLE DEGRADATION COMPENSATION CORRECTIONS...
- Publication number 20190384164
- Publication date Dec 19, 2019
- ASML NETHERLANDS B.V.
- Marcel Theodorus Maria VAN KESSEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC APPARATUS AND LITHOGRAPHIC PROJECTION METHOD
- Publication number 20180095369
- Publication date Apr 5, 2018
- ASML NETHERLANDS B.V.
- Kevin VAN DE RUIT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY