Kevin W. Keirn

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Loveland, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Identification of pin-open faults by capacitive coupling
- Patent number 5,696,451
- Issue date Dec 9, 1997
- Hewlett-Packard Co.
- Kevin W. Keirn
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring the integrity of an electrical contact
- Patent number 5,625,292
- Issue date Apr 29, 1997
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Identification of pin-open faults by capacitive coupling through th...
- Patent number 5,557,209
- Issue date Sep 17, 1996
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Identification of pin-open faults by capacitive coupling through th...
- Patent number 5,254,953
- Issue date Oct 19, 1993
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit transfer test device system utilizing lateral tr...
- Patent number 5,101,152
- Issue date Mar 31, 1992
- Hewlett-Packard Company
- Vance R. Harwood
- G01 - MEASURING TESTING