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Kevin W. Stanley
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St. Albans, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Bit failure signature identification
Patent number
8,451,018
Issue date
May 28, 2013
International Business Machines Corporation
Thomas D. Furland
G01 - MEASURING TESTING
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Patent Grant
Method for optimizing a set of scan diagnostic patterns
Patent number
6,996,791
Issue date
Feb 7, 2006
International Business Machines Corporation
Vanessa Brunkhorst
G01 - MEASURING TESTING
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Patent Grant
Stuck and transient fault diagnostic system
Patent number
6,694,454
Issue date
Feb 17, 2004
International Business Machines Corporation
Kevin W. Stanley
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
BIT FAILURE SIGNATURE IDENTIFICATION
Publication number
20110199114
Publication date
Aug 18, 2011
International Business Machines Corporation
Thomas D. Furland
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OPTIMIZING A SET OF SCAN DIAGNOSTIC PATTERNS
Publication number
20050114747
Publication date
May 26, 2005
International Business Machines Corporation
Vanessa Brunkhorst
G01 - MEASURING TESTING