Kevin William McCauley

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Greene, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Random path delay testing methodology
- Patent number 6,728,914
- Issue date Apr 27, 2004
- Cadence Design Systems, Inc.
- Kevin William McCauley
- G01 - MEASURING TESTING
Information Patent Grant
Method to improve a testability analysis of a hierarchical design
- Patent number 6,532,571
- Issue date Mar 11, 2003
- International Business Machines Corporation
- Richard M. Gabrielson
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing CMOS circuit delay
- Patent number 6,389,577
- Issue date May 14, 2002
- International Business Machines Corporation
- Visweswara Rao Kodali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-timed AC CIO wrap method and apparatus
- Patent number 6,058,496
- Issue date May 2, 2000
- International Business Machines Corporation
- Pamela Sue Gillis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Random path delay testing methodology
- Publication number 20020083386
- Publication date Jun 27, 2002
- International Business Machines Corporation
- Kevin William McCauley
- G01 - MEASURING TESTING