Khader S. Abdel-Hafez

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Power estimation system
- Patent number 11,493,971
- Issue date Nov 8, 2022
- Synopsys, Inc.
- Alexander John Wakefield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
- Patent number 9,696,377
- Issue date Jul 4, 2017
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
- Patent number 7,721,173
- Issue date May 18, 2010
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pipelined scan compression
- Patent number 7,590,905
- Issue date Sep 15, 2009
- Syntest Technologies, Inc.
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
- Patent number 7,552,373
- Issue date Jun 23, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Patent number 7,512,851
- Issue date Mar 31, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for unifying self-test with scan-test during p...
- Patent number 7,444,567
- Issue date Oct 28, 2008
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
- Patent number 7,412,672
- Issue date Aug 12, 2008
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multi-level scan compression
- Patent number 7,231,570
- Issue date Jun 12, 2007
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing ATPG and fault simulation in a scan-based int...
- Patent number 7,210,082
- Issue date Apr 24, 2007
- Syntest Technologies, Inc.
- Khader S. Abdel-Hafez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart capture for ATPG (automatic test pattern generation) and faul...
- Patent number 7,124,342
- Issue date Oct 17, 2006
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for debug, diagnosis, and yield improvement of...
- Patent number 7,058,869
- Issue date Jun 6, 2006
- Syntest Technologies, Inc.
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Grant
Mask network design for scan-based integrated circuits
- Patent number 7,032,148
- Issue date Apr 18, 2006
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DISTRIBUTED TEST PATTERN GENERATION AND SYNCHRONIZATION
- Publication number 20240110973
- Publication date Apr 4, 2024
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Power Estimation System
- Publication number 20210333853
- Publication date Oct 28, 2021
- Synopsys, Inc.
- Alexander John Wakefield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
- Publication number 20090235132
- Publication date Sep 17, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for unifying self-test with scan-test during p...
- Publication number 20090037786
- Publication date Feb 5, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
- Publication number 20080276141
- Publication date Nov 6, 2008
- Syntest Technologies Inc.
- Laung-Terng(L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for pipelined scan compression
- Publication number 20060064614
- Publication date Mar 23, 2006
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for multi-level scan compression
- Publication number 20050268194
- Publication date Dec 1, 2005
- Laung-Terng (L.T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
Smart capture for ATPG (automatic test pattern generation) and faul...
- Publication number 20050262409
- Publication date Nov 24, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Mask network design for scan-based integrated circuits
- Publication number 20050060625
- Publication date Mar 17, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Publication number 20050055617
- Publication date Mar 10, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for unifying self-test with scan-test during p...
- Publication number 20040268181
- Publication date Dec 30, 2004
- Laung-Terng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for debug, diagnosis, and yield improvement of...
- Publication number 20040237015
- Publication date Nov 25, 2004
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing asynchronous set/reset faults in a...
- Publication number 20040153926
- Publication date Aug 5, 2004
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
- Publication number 20030154433
- Publication date Aug 14, 2003
- Laung-Terng Wang
- G01 - MEASURING TESTING

Khader S. Abdel-Hafez

Person

Patents Grantslast 30 patents

Power estimation system

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for pipelined scan compression

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for shifting at-speed scan patterns in a scan-...

Method and apparatus for unifying self-test with scan-test during p...

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for multi-level scan compression

Method for performing ATPG and fault simulation in a scan-based int...

Smart capture for ATPG (automatic test pattern generation) and faul...

Method and apparatus for debug, diagnosis, and yield improvement of...

Mask network design for scan-based integrated circuits

Patents Applicationslast 30 patents

DISTRIBUTED TEST PATTERN GENERATION AND SYNCHRONIZATION

Power Estimation System

METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...

Method and apparatus for unifying self-test with scan-test during p...

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for pipelined scan compression

Method and apparatus for multi-level scan compression

Smart capture for ATPG (automatic test pattern generation) and faul...

Mask network design for scan-based integrated circuits

Method and apparatus for shifting at-speed scan patterns in a scan-...

Method and apparatus for unifying self-test with scan-test during p...

Method and apparatus for debug, diagnosis, and yield improvement of...

Method and apparatus for testing asynchronous set/reset faults in a...

Method and apparatus for broadcasting scan patterns in a scan-based...