Khashayar Shadman

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San Rafael, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Readout methodology for multi-channel acquisition of spatially dist...
- Patent number 8,941,049
- Issue date Jan 27, 2015
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Permanent magnet lens array
- Patent number 8,698,094
- Issue date Apr 15, 2014
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple-column electron beam apparatus and methods
- Patent number 8,455,838
- Issue date Jun 4, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle energy analyzer
- Patent number 8,421,030
- Issue date Apr 16, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse focusing action in hyperbolic field detectors
- Patent number 8,237,120
- Issue date Aug 7, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Auger electron spectrometer with applied magnetic field at target s...
- Patent number 7,755,042
- Issue date Jul 13, 2010
- KLA-Tencor Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE-COLUMN ELECTRON BEAM APPARATUS AND METHODS
- Publication number 20130001418
- Publication date Jan 3, 2013
- Khashayar SHADMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
READOUT METHODOLOGY FOR MULTI-CHANNEL ACQUISITION OF SPATIALLY DIST...
- Publication number 20120029854
- Publication date Feb 2, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS