Khushboo Agarwal

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Testing of integrated circuits during at-speed mode of operation
- Patent number 11,333,707
- Issue date May 17, 2022
- Texas Instruments Incorporated
- Khushboo Agarwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION
- Publication number 20200132763
- Publication date Apr 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Khushboo Agarwal
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION
- Publication number 20150212152
- Publication date Jul 30, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Khushboo Agarwal
- G01 - MEASURING TESTING