Ki W. Yoon

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Folsom, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System, apparatus and method for inter-die functional testing of an...
- Patent number 11,105,854
- Issue date Aug 31, 2021
- Intel Corporation
- Lakshminarayana Pappu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to trigger and trace on-chip system fabric tra...
- Patent number 9,223,668
- Issue date Dec 29, 2015
- Intel Corporation
- Ki Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cached dirty bits for context switch consistency checks
- Patent number 8,261,028
- Issue date Sep 4, 2012
- Intel Corporation
- Ki W. Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control word prediction and varying recovery upon comparing actual...
- Patent number 7,249,243
- Issue date Jul 24, 2007
- Intel Corporation
- Mohammad A. Abadallah
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System, Apparatus And Method For Inter-Die Functional Testing Of An...
- Publication number 20190033368
- Publication date Jan 31, 2019
- Intel Corporation
- Lakshminarayana Pappu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO TRIGGER AND TRACE ON-CHIP SYSTEM FABRIC TRA...
- Publication number 20140281724
- Publication date Sep 18, 2014
- YOON KI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CACHED DIRTY BITS FOR CONTEXT SWITCH CONSISTENCY CHECKS
- Publication number 20090172298
- Publication date Jul 2, 2009
- Ki W. Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual prediction for control registers in a speculatively executi...
- Publication number 20050033946
- Publication date Feb 10, 2005
- Mohammad A. Abadallah
- G06 - COMPUTING CALCULATING COUNTING