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Ki-Won Oh
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Yongin-City, KR
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Patents Grants
last 30 patents
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Patent Grant
Inspection system using scanning electron microscope
Patent number
8,890,067
Issue date
Nov 18, 2014
Samsung Display Co., Ltd.
Young-Gil Park
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
CRYSTALLIZED SAMPLE INSPECTION APPARATUS
Publication number
20140307080
Publication date
Oct 16, 2014
Ki-Hyun KIM
G01 - MEASURING TESTING
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Patent Application
INSPECTION SYSTEM USING SCANNING ELECTRON MICROSCOPE
Publication number
20130320211
Publication date
Dec 5, 2013
Young-Gil Park
H01 - BASIC ELECTRIC ELEMENTS